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Angewandte Chemie - International Edition

Volumn 43, Issue 48, 2004, Pages 6745-6747

The chemical application of high-resolution electron tomography: Bright field or dark field?

(7) Thomas, John Meurig a,b Midgley, Paul A a Yates, Timothy J V a Barnard, Jonathan S a Raja, Robert a Arslan, Ilke a Weyland, Matthew c

a UNIVERSITY OF CAMBRIDGE (United Kingdom)

b DAVY FARADAY RESEARCH LABORATORY (United Kingdom)

c School of Operations Research and Industrial Engineering (United States)

Author keywords

Electron tomography; Heterogeneous catalysis; Nanoparticles; Scanning probe microscopy

Indexed keywords

IMAGING TECHNIQUES; NONDESTRUCTIVE EXAMINATION; OPTICAL RESOLVING POWER; SILICA; THREE DIMENSIONAL; VISUALIZATION;

HIGH-ANGLE ANNULAR DARK-FIELD (HAADF); HIGH-RESOLUTION ELECTRON TOMOGRAPHY; THREE DIMENSIONAL STRUCTURES;

ELECTRIC IMPEDANCE TOMOGRAPHY;

PLATINUM; RUTHENIUM; SILICON DIOXIDE;

ARTICLE; BRIGHT FIELD ELECTRON TOMOGRAPHY; BRIGHTNESS; CATALYST; DARKNESS; ELECTRON BEAM; HIGH ANGLE ANNULAR DARK FIELD ELECTRON TOMOGRAPHY; IMAGE ANALYSIS; IMAGE DISPLAY; IMAGING SYSTEM; NANOPARTICLE; POROSITY; REFRACTION INDEX; SCANNING TRANSMISSION ELECTRON MICROSCOPY; THREE DIMENSIONAL IMAGING; TOMOGRAPHY;

EID: 10944232387 PISSN: 14337851 EISSN: None Source Type: Journal
DOI: 10.1002/anie.200461453 Document Type: Article

Times cited : (60)

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- note
- 2] particles are approximately 0.4 nm diameter.

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