Electronic bonding revealed by electron diffraction

Science

Volumn 331, Issue 6024, 2011, Pages 1528-1529

  Midgley, Paul A ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; CHEMICAL BONDING; ELECTRON; EXPERIMENTAL STUDY;

ATOM; CHEMICAL BOND; CRYSTAL; CRYSTALLOGRAPHY; ELECTRIC POTENTIAL; ELECTRON; ELECTRON DIFFRACTION; GEOMETRY; POISSON DISTRIBUTION; PRIORITY JOURNAL; SEMICONDUCTOR; SHORT SURVEY; SIMULATION; STATIC ELECTRICITY; VIBRATION; X RAY;

EID: 79953128581     PISSN: 00368075     EISSN: 10959203     Source Type: Journal    
DOI: 10.1126/science.1203614     Document Type: Short Survey

References (9)

1. P. N. H. Nakashima, A. E. Smith, J. Etheridge, B. C. Muddle, Science 331, 1583 (2011).
2. R. Vincent, D. Bird, J. W. Steeds, Philos. Mag. A 50, 745 (1984).
3. R. Henderson, P. N. Unwin, Nature 257, 28 (1975).
4. R. Vincent, P. A. Midgley, Ultramicroscopy 53, 271 (1994).
5. D. Watanabe, R. Uyeda, A. Fukuhara, Acta Crystallogr. A24, 580 (1968).
6. P. A. Midgley, M. Saunders, Contemp. Phys. 37, 441 (1996).
7. J. M. Zuo, M. Kim, M. O'Keeffe, J. C. H. Spence, Nature 401, 49 (1999).
8. M. Saunders, A. G. Fox, P. A. Midgley, Acta Crystallogr. A55, 471 (1999).
9. P. N. H. Nakashima, B. C. Muddle, Phys. Rev. B 81, 115135 (2010).