A significant structural advance using STEM

ChemPhysChem

Volumn 9, Issue 10, 2008, Pages 1363-1365

  Thomas, John Meurig ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

Aberration correction complex mixed oxides; High angle annular dark field (HAADF); Microscopy scanning transmission electron microscopy (STEM); Selective oxidation catalysts

Indexed keywords

CATALYSTS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; SCANNING ELECTRON MICROSCOPY;

ABERRATION-CORRECTED; HIGH-ANGLE ANNULAR DARK FIELDS; MIXED OXIDE; RELIABLE MODELS; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SELECTIVE OXIDATION CATALYSTS; STRUCTURAL STUDIES; TRANSMISSION ELECTRON MICROGRAPH;

RIETVELD REFINEMENT;

EID: 47949104031     PISSN: 14394235     EISSN: 14397641     Source Type: Journal    
DOI: 10.1002/cphc.200800190     Document Type: Short Survey

References (30)

1. W. D. Pyrz, D. A. Blom, T. Vogt, D. J. Buttrey, Angew. Chem. 2008, 120, 2830-2833;
2. Angew. Chem. Int. Ed. 2008, 47, 2788-2791.
3. P. E. Batson, N. Delby, O. L. Krivanek, Nature 2002, 418, 617-620.
4. a) J. M. Thomas in Physical Biology: From Atoms to Medicine (Ed.: A. H. Zewail), World Scientifics, Singapore, 2008, pp. 51-113;
5. b) J. J. Buchley, P. L. Gai, A. F. Lee, L. Olivi, K. Wilson, J. Am. Chem. Soc. 2008, unpublished results.
6. E. Prince in The Rietveld Method (Ed.: R. A. Young), Oxford Universtiy Press, New York, 1993, pp. 43-54.
7. M. A. Roberts, G. Sankar, J. M. Thomas, R. H. Jones, H. Du, J. Chen, W. Pang, R. Xu, Nature 1996, 381, 401-404.
8. Solids: Characterization by Powder Diffraction T. Vogt in Encyclopedia of Inorganic Chemistry, 2nd ed., Wiley, New York, 2005.
9. D. Albesa-Jova, B. M. Narinki, S. J. Kitchen, L. Grice, E. Y. Cheung, K. D. M. Harris, ChemPhysChem 2004, 5, 414-418.
10. K. D. M. Harris, F. Guo, J. Am. Chem. Soc. 2005, 127, 7314-7315.
11. a) P. DeSanto, D. J. Buttrey, R. K. Grasseli, C. G. Lugmair, A. F. Volpe, Jr., B. H. Toby, T. Vogt, Z. Kristallogr. 2004, 219, 152-165;
12. b) T. Umezawa, A. Kayou, K. O'Shima, I. Sawaki, T. Ushikubo, European Patent 1993 No. 529,853.
13. P. DeSanto, Jr., D. J. Buttrey, R. K. Grasselli, C. G. Lugmair, A. F. Volpe, Jr., B. H. Toby, T. Vogt, Top. Catal. 2003, 23, 23-38.
14. P. De Santo, Jr., D. J. Buttrey, R. K. Grasselli, C. G. Lugmair, A. F. Vope, Jr., B. H. Toby, T. Vogt, J. Solid State Chem., unpublished results.
15. H. Murayama, D. Vitny, W. Ueda, G. Fuchs, M. Anne, J. L. Dubois, Appl. Catal. A 2007, 318, 137-142.
16. M. Sadakane, W. Ueda in Turning Points in Solid-State, Materials and Surface Science (Ed.: K. D. M. Harris, P. P. Edwards), Royal Society of Chemistry, Cambridge, 2008, pp. 507-518.
17. a) P. DeSanto, Jr., D. J. Buttrey, R. K. Grasselli, C. G. Lugmair, A. F. Volpe, B. H. Toby, T. Vogt, Top. Catal. 2003, 23, 23-28;
18. b) R. K. Grasselli, C. G. Lugmair, A. F. Volpe, Top. Catal. 2008, unpublished results.
19. P. DeSanto, D. J. Buttrey, R. K. Grasselli, W. D. Pyrz, C. G. Lugmair, A. F. Volpe, B. T. Vogt, B. H. Toby, Top. Catal. 2006, 38, 31-40.
20. H. Rose, Optik 1990, 85, 19-24.
21. M. Haider, S. Uhlemann, E. Schwan, B. Babius, H. Robe, K. Unbam, Nature 1998, 392, 768-769.
22. E. P. W. Ward, I. Arslan, P. A. Midgley, A. Bleloch, J. M. Thomas, Chem. Commun. 2005, 5805.
23. Characterisation of Nanomaterials (Eds.: A. I. Kirkland, J. L. Hutchison), Royal Society of Chemistry, Cambridge, 2007.
24. A. Howie, J. Microsc. 1979, 117, 11-23.
25. S. B. Rice, J. Y. Koo, M. M. Disko, M. M. J. Treacy, Ultramicroscopy 1990, 34, 108-118.
26. For a concise account of the Moodie and Cowley "multi-slice" method see J. C. H. Spence, High-Resolution Electron Microscopy, 3rd ed., Oxford University Press, New York, 2003.
27. A. I. Kirkland, R. Meyer, Microsc. Microanal. 2004, 10, 401-404.
28. L. C. Gontard, L. Y. Chang, C. J. Hetherington, A. I. Kirkland, D. Ozkaya, R. E. Dunin-Borkowski, Angew. Chem. 2007, 119, 3757-3759;
29. Angew. Chem. Int. Ed. 2007, 46, 3683-3686.
30. W. H. Goddard III, K. Chenoweth, S. Pudar, A. C. T. van Duin, M. J. Cheng, Top. Catal. 2008, DOI: 10.1007/s11244-008-9096-xl2.