Femtosecond electron diffraction: Direct probe of ultrafast Structural dynamics in metal films

Microscopy Research and Technique

Volumn 72, Issue 3, 2009, Pages 131-143

  Shouhua, Nie ^a   Wang, Xuan ^a   Junjie, Li ^a   Clinite, Richard ^a   Jianming, Cao ^a  

^a FLORIDA STATE UNIVERSITY   (United States)

Author keywords

Coherent phonon; Electronic gr neisen parameter; Electronic thermal expansion; FED

Indexed keywords

DYNAMICS; ELECTRON DIFFRACTION; ELECTRONS; HOT ELECTRONS; MAGNETIC MATERIALS; PHONONS; STRUCTURAL DYNAMICS; TRANSITION METALS;

COHERENT PHONONS; DIRECT PROBE; ELECTRONIC GRÜNEISEN PARAMETER; ELECTRONIC THERMAL EXPANSION; FED; FEMTOSECOND ELECTRON DIFFRACTION; IN-PHASE; METAL-FILMS; TIME-SCALES; ULTRA-FAST;

THERMAL EXPANSION;

FERROMAGNETIC MATERIAL;

ARTICLE; ELECTRON; ELECTRON DIFFRACTION; FEMTOSECOND ELECTRON DIFFRACTION; MICROFILM; PHONON; PRIORITY JOURNAL;

EID: 61449262897     PISSN: 1059910X     EISSN: 10970029     Source Type: Journal    
DOI: 10.1002/jemt.20666     Document Type: Article

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