Measuring the true height of water films on surfaces

Nanotechnology

Volumn 22, Issue 46, 2011, Pages

  Santos, Sergio ^a   Verdaguer, Albert ^b   Souier, Tewfic ^a   Thomson, Neil H ^c   Chiesa, Matteo ^a,d  

^a KHALIFA UNIVERSITY   (United Arab Emirates)

^b CATALAN INSTITUTE OF NANOSCIENCE AND NANOTECHNOLOGY ICN2   (Spain)

^c UNIVERSITY OF LEEDS   (United Kingdom)

^d Massachusetts Institute of Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMBIENT CONDITIONS; HETEROGENEOUS SURFACE; INTERMITTENT-CONTACTS; NON-CONTACT MODE; OPERATIONAL PARAMETERS; TRUE HEIGHT; WATER FILM; WATER LAYERS;

ATOMIC FORCE MICROSCOPY;

HYDROPHILICITY;

WATER;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL PHENOMENA; CHEMISTRY; METHODOLOGY; SURFACE PROPERTY;

HYDROPHOBIC AND HYDROPHILIC INTERACTIONS; MICROSCOPY, ATOMIC FORCE; SURFACE PROPERTIES; WATER;

EID: 80155195465     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/22/46/465705     Document Type: Article

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