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1
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0033614026
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Piner, R. D.; Zhu, J.; Xu, F.; Hong, S.; Mirkin, C. A. Science 1999, 283, 661.
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(1999)
Science
, vol.283
, pp. 661
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Piner, R.D.1
Zhu, J.2
Xu, F.3
Hong, S.4
Mirkin, C.A.5
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2
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0344339016
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Hong, S.; Zhu, J.; Mirkin, C. A. Science 1999, 286, 523.
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(1999)
Science
, vol.286
, pp. 523
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Hong, S.1
Zhu, J.2
Mirkin, C.A.3
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3
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0000457470
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Noy, A.; Miller, A. E.; Klare, J. E.; Weeks, B. L.; Woods, B. W.; DeYoreo, J. J. Nano Lett. 2002, 2, 109.
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(2002)
Nano Lett.
, vol.2
, pp. 109
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Noy, A.1
Miller, A.E.2
Klare, J.E.3
Weeks, B.L.4
Woods, B.W.5
DeYoreo, J.J.6
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4
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0035923512
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Wilson, D. L.; Martin, R.; Hong, S.; Cronin-Golomb, M.; Mirkin, C. A.; Kaplan, D. L. Proc. Natl. Acad. Sci. U. S. A. 2001, 98, 13660.
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Proc. Natl. Acad. Sci. U. S. A. 2001
, vol.98
, pp. 13660
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Wilson, D.L.1
Martin, R.2
Hong, S.3
Cronin-Golomb, M.4
Mirkin, C.A.5
Kaplan, D.L.6
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5
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0037036108
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Demers, L. M.; Ginger, D. S.; Li, Z.; Park, S.-J.; Chung, S.-W.; Mirkin, C. A. Science, 2002, 296, 1836.
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(2002)
Science
, vol.296
, pp. 1836
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Demers, L.M.1
Ginger, D.S.2
Li, Z.3
Park, S.-J.4
Chung, S.-W.5
Mirkin, C.A.6
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6
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0037181072
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Su, M.; Liu, X.; Li, S.-Y.; Dravid, V. P.; Mirkin, C. A. J. Am. Chem. Soc. 2002, 124, 1560.
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(2002)
J. Am. Chem. Soc.
, vol.124
, pp. 1560
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Su, M.1
Liu, X.2
Li, S.-Y.3
Dravid, V.P.4
Mirkin, C.A.5
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7
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0037022410
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Liu, X.; Fu, L.; Hong, S.; Dravid, V. P.; Mirkin, C. A. Adv. Mater. 2002, 14, 231.
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(2002)
Adv. Mater.
, vol.14
, pp. 231
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Liu, X.1
Fu, L.2
Hong, S.3
Dravid, V.P.4
Mirkin, C.A.5
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8
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0033335203
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Hong, S.; Zhu, J.; Mirkin, C. A. Langmuir 1999, 15, 7897.
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(1999)
Langmuir
, vol.15
, pp. 7897
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Hong, S.1
Zhu, J.2
Mirkin, C.A.3
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9
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0037048612
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Ivanisevic, A.; McCumber, K. V.; Mirkin, C. A. J. Am. Chem. Soc. 2002, 124, 11997.
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(2002)
J. Am. Chem. Soc.
, vol.124
, pp. 11997
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Ivanisevic, A.1
McCumber, K.V.2
Mirkin, C.A.3
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10
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0035827974
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Jang, J.; Hong, S.; Schatz, G. C.; Ratner, M. A. J. Chem. Phys. 2001, 115, 2721.
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(2001)
J. Chem. Phys.
, vol.115
, pp. 2721
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Jang, J.1
Hong, S.2
Schatz, G.C.3
Ratner, M.A.4
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11
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1242275848
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note
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Weeks, B. L.; Noy, A.; Miller, A. E.; De Yoreo, J. J. Phys. Rev. Lett. 2002, 88, 255505, a recent private communication with Weeks confirms that MHA can be patterned at a relative humidity below 15% as well.
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(2002)
Phys. Rev. Lett.
, vol.88
, pp. 255505
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Weeks, B.L.1
Noy, A.2
Miller, A.E.3
De Yoreo, J.J.4
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15
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0012865642
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TM Microscopes. 1171 Borregas Avenue, Sunnyvale, CA 94089
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http://www.thermomicroscopes.com/products/cp.htm; TM Microscopes. 1171 Borregas Avenue, Sunnyvale, CA 94089
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16
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0012794597
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Plas Labs, 917 E. Chilson Str., Lansing, MI 48906. Phone: (517) 372 7177. (800) 866 7527
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Plas Labs, 917 E. Chilson Str., Lansing, MI 48906. Phone: (517) 372 7177, (800) 866 7527.
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17
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0012880547
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note
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Air Products and Chemicals. Nitrogen: Nitrogen, 99.998%. Oxygen less than 0.0010%. Hydrogen less than 0.0002%. Methane less than 0.0001%. Carbonaceous gases less than 0.0001%. Dew point -90 °F.
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18
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0012880548
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note
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Fisher Scientific, Fisherbrand Certified Traceable Digital Hygrometer/Thermometer, Instant model.
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19
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0034315718
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Gold coated substrates (60 nm Au, 10 nm Ti on Si) were prepared according to procedure described in Weinberger, D. A.; Hong, S.; Mirkin, C. A.; Wessels, B. W.; Higgins, T. B. Adv. Mater. 2000, 12, 1600.
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(2000)
Adv. Mater.
, vol.12
, pp. 1600
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Weinberger, D.A.1
Hong, S.2
Mirkin, C.A.3
Wessels, B.W.4
Higgins, T.B.5
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20
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0012809239
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note
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To determine the appropriate equilibration time between experiments, 10, 30, and 60 min time intervals were studied. We found that the use of larger intervals (30 and 60 min) made no appreciable difference in the observed temperature dependence.
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0012860043
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note
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The bands assigned to the patterned area include a small tip-convolution contribution. This artifact has an insignificant effect on the force gradient analysis (<10%). Assuming a standard silicon tip with a 10 nm radius of curvature and a tightly formed dot that is 1.6 nm high, tip convolution creates a lateral force contribution 5.4 nm from the edge of the dot. Since the smallest dots generated in these experiments were 100 nm, the contribution to the gradient distribution is relatively insignificant.
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24
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0032598466
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Piranha-cleaned tips were utilized to exclude deposition of contaminants accumulated on the tip. However, treating tips in piranha makes silicon probes hydrophilic which results in a decrease in the resolution of the LFM images. Formation of the meniscus was also confirmed with tips modified with ODT and dodecylamine. Notably, the use of tips coated with 1-dodecylamine provides significantly better LFM images compared to those taken with bare tips. (Piner, R. D.; Hong, S.; Mirkin, C. A. Langmuir 1999, 15, 5457).
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(1999)
Langmuir
, vol.15
, pp. 5457
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Piner, R.D.1
Hong, S.2
Mirkin, C.A.3
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0012895721
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note
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3.
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0034668528
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Stifter, T.; Marti, O.; Bhushan, B. Phys. Rev. B 2000, 62, 13667.
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(2000)
Phys. Rev. B
, vol.62
, pp. 13667
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Stifter, T.1
Marti, O.2
Bhushan, B.3
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0036492231
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Jang, J.; Schatz, G. C.; Ratner, M. A. J. Chem. Phys. 2002, 116, 3875.
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(2002)
J. Chem. Phys.
, vol.116
, pp. 3875
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Jang, J.1
Schatz, G.C.2
Ratner, M.A.3
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0012855776
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2/2 = 3/2kT.
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31
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0012808475
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note
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This relationship will depend on the particular contact time and writing speed chosen. For example, for the MHA dot and line patterns generated with a holding time of 4 s, and writing speed of 0.5 μm/s (respectively), or for ODT dots and lines patterned at a contact time of 3 s and a writing speed of 0.2 μm/s, the growth rate of lines is twice that of dots.
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