Study of tip-sample interaction in scanning force microscopy

Applied Surface Science

Volumn 157, Issue 4, 2000, Pages 285-289

  Luna, M ^a   Colchero, J ^a   Gomez Herrero J ^a   Baro A M ^a  

^a UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

FORCE MEASUREMENT; MICROSCOPIC EXAMINATION; NATURAL FREQUENCIES; OSCILLATIONS;

SCANNING FORCE MICROSCOPY;

MICROSCOPES;

EID: 0033742955     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(99)00540-1     Document Type: Article

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