|
Volumn 2, Issue 10, 2010, Pages 2069-2072
|
Additive nanoscale embedding of functional nanoparticles on silicon surface
|
Author keywords
[No Author keywords available]
|
Indexed keywords
FUNCTIONAL NANOPARTICLES;
IN-LINE;
LOGIC STRUCTURES;
NANO SCALE;
SILICON SURFACES;
NANOPARTICLES;
SILICON COMPOUNDS;
SILICON OXIDES;
COBALT;
FERRIC ION;
FERRIC OXIDE;
NANOMATERIAL;
NANOPARTICLE;
SILICON;
SILICON DIOXIDE;
ARTICLE;
ATOMIC FORCE MICROSCOPY;
CATALYSIS;
CHEMISTRY;
ELECTRIC CONDUCTIVITY;
ELECTRONICS;
MATERIALS TESTING;
METHODOLOGY;
NANOTECHNOLOGY;
CATALYSIS;
COBALT;
ELECTRIC CONDUCTIVITY;
ELECTRONICS;
FERRIC COMPOUNDS;
MATERIALS TESTING;
MICROSCOPY, ATOMIC FORCE;
NANOPARTICLES;
NANOSTRUCTURES;
NANOTECHNOLOGY;
SILICON;
SILICON DIOXIDE;
|
EID: 77957896096
PISSN: 20403364
EISSN: 20403372
Source Type: Journal
DOI: 10.1039/c0nr00315h Document Type: Article |
Times cited : (27)
|
References (42)
|