Anomalies in thickness measurements of graphene and few layer graphite crystals by tapping mode atomic force microscopy

Carbon

Volumn 46, Issue 11, 2008, Pages 1435-1442

  Nemes Incze, P ^a   Osvath Z ^a   Kamaras K ^b   Biro L P ^a  

^a RESEARCH INSTITUTE FOR TECHNICAL PHYSICS AND MATERIALS SCIENCE   (Hungary)

^b INSTITUTE OF EXPERIMENTAL MEDICINE   (Hungary)

Author keywords

[No Author keywords available]

Indexed keywords

ARCHITECTURAL ACOUSTICS; ATOMIC FORCE MICROSCOPY; ATOMIC PHYSICS; ATOMS; CARBON; CRYSTALLOGRAPHY; FINANCIAL DATA PROCESSING; GRAPHITE; MICROSCOPIC EXAMINATION; MOLECULAR BEAM EPITAXY; MULTILAYER FILMS; NONMETALS; SCANNING PROBE MICROSCOPY; SILICA; SILICON COMPOUNDS; THICKNESS MEASUREMENT;

GRAPHENE; GRAPHENE LAYERS; GRAPHITE CRYSTALS; IMAGING MECHANISM; MEASUREMENT PARAMETERS; MULTILAYER GRAPHENE; SILICON OXIDE SURFACES; TAPPING MODE; TAPPING-MODE ATOMIC FORCE MICROSCOPY;

IMAGING TECHNIQUES;

EID: 49349095015     PISSN: 00086223     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.carbon.2008.06.022     Document Type: Article

References (30)

1. Wallace P.R. The band theory of graphite. Phys Rev 71 (1947) 622-634
2. Novoselov K.S., Geim A.K., Morozov S.V., Jiang D., Zhang Y., Dubonos V., et al. Electric field effect in atomically thin carbon films. Science 306 (2004) 666-669
3. Novoselov K.S., Jiang D., Schedin F., Booth T.J., Khotkevich V.V., Morozov S.V., et al. Two-dimensional atomic crystals. Proc Natl Acad Sci USA 102 (2005) 10451-10453
4. Landau LD, Lifshitz EM. Statistical physics, part I. Oxford: Pergamon Press; 1980.
5. Mermin N.D. Crystalline order in two dimensions. Phys Rev 176 (1968) 250-254
6. Katsnelson M.I. Graphene: carbon in two dimensions. Mater Today 10 (2007) 20-27
7. Novoselov K.S., McCann E., Morozov S.V., Fal'Ko V.I., Katsnelson M.I., Zeitler U., et al. Unconventional quantum Hall effect and Berry's phase of 2π in bilayer graphene. Nat Phys 2 (2006) 177-180
8. Heersche H., Jarillo-Herrero P., Oostinga J.B., Vandersypen L.M.K., and Morpurgo A.F. Nature 446 (2007) 56-59
9. Stolyarova E., Rim K.T., Ryu S., Maultzsch J., Kim P., Brus L.E., et al. High-resolution scanning tunneling microscopy imaging of mesoscopic graphene sheets on an insulating surface. Proc Natl Acad Sci USA 104 (2007) 9209-9212
10. Schedin F., Geim A.K., Morozov S.V., Hill E.W., Blake P., Katsnelson M.I., et al. Detection of individual gas molecules adsorbed on graphene. Nat Mater 6 (2007) 652-655
11. Dikin D.A., Stankovich S., Zimney E.J., Piner R.D., Dommett G.H.B., Evmenenko G., et al. Preparation and characterization of graphene oxide paper. Nature 448 (2007) 457-460
12. Novoselov K.S., Geim A.K., Morozov S.V., Jiang D., Katsnelson M.I., Grigorieva I.V., et al. Two-dimensional gas of massless Dirac fermions in graphene. Nature 438 (2005) 197-200
13. Roddaro S., Pingue P., Piazza V., Pellegrini V., and Beltram F. The optical visibility of graphene: interference colors of ultrathin graphite on SiO2. Nano Lett 7 (2007) 2707-2710
14. Blake P., Hill E.W., Castro Neto A.H., Novoselov K.S., Jiang D., Yang R., et al. Making graphene visible. Appl Phys Lett 91 (2007) 063124
15. Chen Z., Lin Y.-M., Rooks M.J., and Avouris P. Graphene nano-ribbon electronics. Physica E 40 (2007) 228-232
16. Sidorov A.N., Yazdanpanah M.M., Jalilian R., Jouseph P., Cohn R.W., and Sumanasekera G.U. Electrostatic deposition of graphene. Nanotechnology 18 (2007) 135301
17. Mechler A., Kopniczky J., Kokavecz J., Hoel A., Granqvist C.-G., et al. Anomalies in nanostructure size measurements by AFM. Phys Rev B 72 (2005) 125407
18. Mechler A., Kokavecz J., Heszler P., and Lal R. Surface energy maps of nanostructures: atomic force microscopy and numerical simulation study. Appl Phys Lett 82 (2003) 3740-3742
19. Kühle A., Sørensen A.H., Zandbergen J.B., and Bohr J. Contrast artifacts in tapping tip atomic force microscopy. Appl Phys A 66 (1998) S329-S332
20. Gupta A., Chen G., Joshi P., Tadigadapa S., and Eklund P.C. Raman scattering from high-frequency phonons in supported n-graphene layer films. Nano Lett 6 (2006) 2667-2673
21. Ferrari C., Meyer J.C., Scardaci V., Casiraghi C., Lazzeri M., Mauri F., et al. Raman spectrum of graphene and graphene layers. Phys Rev Lett 97 (2006) 187401
22. Graf D., Molitor F., Ensslin K., Stampfer C., Jungen A., Hierold C., et al. Spatially resolved Raman spectroscopy of single- and few-layer graphene. Nano Lett 7 (2007) 238-242
23. Casiraghi C., Hartschuh A., Lidorikis E., Qian H., Harutyunyan H., Gokus T., et al. Rayleigh imaging of graphene and graphene layers. Nano Lett 7 (2007) 2711-2717
24. Ni Z.H., Wang H.M., Kasim J., Fan H.M., Yu T., Wu Y.H., et al. Graphene thickness determination using reflection and contrast spectroscopy. Nano Lett 7 (2007) 2758-2763
25. Jung I., Pelton M., Piner R., Dikin D.A., Stankovich S., Watcharotone S., et al. Simple approach for high-contrast optical imaging and characterization of graphene-based sheets. Nano Lett 7 (2007) 3569-3575
26. Kühle A., Sorensen A.H., and Bohr J. Role of attractive forces in tapping tip force microscopy. J Appl Phys 81 (1997) 6562-6569
27. Zitzler L., Herminghaus S., and Mugele F. Capillary forces in tapping mode atomic force microscopy. Phys Rev B 66 (2002) 155436
28. Anczykowski B., Krüger D., Babcock K.L., and Fuchs H. Basic properties of dynamic force spectroscopy with the scanning force microscope in experiment and simulation. Ultramicroscopy 66 (1996) 251-259
29. Garcia R., and San Paulo A. Attractive and repulsive tip-sample interaction regimes in tapping-mode atomic force microscopy. Phys Rev B 60 (1999) 4961-4967
30. Ouyang Q., Ishida K., and Okada K. Investigation of micro-adhesion by atomic force microscopy. Appl Surf Sci 169-170 (2001) 644-648