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Journal of Applied Physics

Volumn 110, Issue 7, 2011, Pages

Graphene formation on step-free 4H-SiC(0001)

(4) Bolen, M L a,c Colby, R a,d Stach, E A b Capano, M A a

a PURDUE UNIVERSITY (United States)

b BROOKHAVEN NATIONAL LABORATORY (United States)

c NATIONAL RENEWABLE ENERGY LABORATORY (United States)

d PACIFIC NORTHWEST NATIONAL LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CROSS SECTIONAL TRANSMISSION ELECTRON MICROSCOPY; GRAPHITIC FILMS; IN-VACUUM; PEAK POSITION; PEAK WIDTHS; RED-SHIFTED; SURFACE PITS; THREADING DISLOCATION; THREE ORDERS OF MAGNITUDE;

ATOMIC FORCE MICROSCOPY; RAMAN SPECTROSCOPY; SILICON CARBIDE; TRANSMISSION ELECTRON MICROSCOPY;

GRAPHENE;

EID: 80055014866 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3644933 Document Type: Article

Times cited : (12)

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