Distinguishing magnetic and electrostatic interactions by a Kelvin probe force microscopy- magnetic force microscopy combination

Beilstein Journal of Nanotechnology

Volumn 2, Issue 1, 2011, Pages 552-560

  Jaafar, Miriam ^a,b   Iglesias Freire, Oscar ^a   Serrano Ramón, Luis ^c   Ibarra, Manuel Ricardo ^c   de Teresa, Jose Maria ^c   Asenjo, Agustina ^a  

^a INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

^b UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

^c UNIVERSITY OF ZARAGOZA   (Spain)

Author keywords

Electrostatic interaction; Focused electron beam induced deposition; Kelvin probe force microscopy; Magnetic force microscopy; Magnetic nanostructures

Indexed keywords

CARBON BASED MATERIALS; CO NANOSTRUCTURES; DOMAIN CONFIGURATIONS; ELECTRONIC BEHAVIORS; ELECTROSTATIC CONTRIBUTIONS; FERROMAGNETIC NANOSTRUCTURES; FOCUSED ELECTRON BEAM INDUCED DEPOSITION; FREQUENCY SHIFT; KELVIN PROBE FORCE MICROSCOPY; LONG RANGE; LONG RANGE INTERACTIONS; LOW DIMENSIONAL; MAGNETIC FORCE; MAGNETIC INTERACTIONS; MAGNETIC NANOSTRUCTURES; MAGNETIC SIGNALS; NANOMAGNETS; POTENTIAL DIFFERENCE; REAL TIME; SUPERPARAMAGNETIC NANOPARTICLES; TIP-SAMPLE FORCES; TIP-SAMPLE INTERACTION; WEAK MAGNETIC FIELDS;

DEPOSITION; ELECTRON BEAMS; ELECTROSTATIC FORCE; ELECTROSTATIC SEPARATORS; FERROMAGNETIC MATERIALS; FERROMAGNETISM; FILMS; MAGNETIC FIELDS; MAGNETIC MOMENTS; NANOMAGNETICS; NANOSTRUCTURES; PROBES; SCANNING TUNNELING MICROSCOPY; SIGNAL DETECTION; SUPERPARAMAGNETISM; SYNTHETIC METALS;

MAGNETIC FORCE MICROSCOPY;

EID: 80054789227     PISSN: None     EISSN: 21904286     Source Type: Journal    
DOI: 10.3762/bjnano.2.59     Document Type: Article

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