Calibration of coercive and stray fields of commercial magnetic force microscope probes

IEEE Transactions on Nanotechnology

Volumn 7, Issue 3, 2008, Pages 245-250

  Jaafar, Miriam ^b   Asenjo, Agustina ^b   Vázquez, Manuel ^a,b  

^a IEEE

^b INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

Author keywords

Coercive field; Magnetic force microscopy (MFM) probes; Stray field

Indexed keywords

CALIBRATION; IMAGE ANALYSIS; MAGNETIC FIELD EFFECTS; MAGNETIC FORCE MICROSCOPY; MAGNETIZATION;

COERCIVE FIELD; MAGNETIC FORCE MICROSCOPY (MFM) PROBES; STRAY FIELD;

PROBES;

EID: 44049104373     PISSN: 1536125X     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNANO.2008.917785     Document Type: Article

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