Magnetic force microscopy with work function compensation

Journal of Applied Physics

Volumn 96, Issue 1, 2004, Pages 494-497

  Yu, Jun ^a   Ahner, Joachim ^a   Weller, Dieter ^a  

^a SEAGATE RESEARCH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH-DENSITY MAGNETIC RECORDING; MAGNETIC FORCE MICROSCOPY (MFM); MAGNETIC IMAGES; SPATIAL RESOLUTIONS;

ATOMIC FORCE MICROSCOPY; DETECTORS; ELECTROSTATICS; FERROMAGNETIC MATERIALS; GAIN CONTROL; IMAGING TECHNIQUES; INTERFEROMETERS; MAGNETIC SEPARATION; MAGNETIZATION; PHASE SHIFT; PROTECTIVE COATINGS; SURFACE TOPOGRAPHY;

MAGNETOSTATICS;

EID: 3142728563     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1757029     Document Type: Article

References (28)

1. D. Rugar, H. J. Mamin, P. Guethner, S. E. Lambert, J. E. Stern, I. McFadyen, and T. Yogi, J. Appl. Phys. 68, 1169 (1990).
2. A. Wadas and P. P. Grutter, Phys. Rev. B 39, 12013 (1989).
3. S. Porthun, L. Abelmann, and C. Lodder, J. Magn. Magn. Mater. 182, 238 (1998).
4. J. M. Garcia, A. Thiaville, J. Miltat, K. J. Kirk, J. N. Chapman, and F. Alouges, Appl. Phys. Lett. 79, 656 (2001).
5. L. Abelmann et al., J. Magn. Magn. Mater. 190, 135 (1998).
6. G. N. Phillips and T. Suzuki, J. Magn. Magn. Mater. 175, 115 (1997).
7. T. K. Taguchi, A. Takeo, and Y. Tanaka, IEEE Trans. Magn. 34, 1973 (1998).
8. P. Glijer, E. N. Abarra, H. Kisker, and T. Suzuki, IEEE Trans. Magn. 32, 3557 (1996).
9. P. Rice and J. R. Hoinville, IEEE Trans. Magn. 32, 3563 (1996).
10. E. T. Yen, H. J. Richter, G. L. Chen, and G. Rauch, IEEE Trans. Magn. 33, 2701 (1997).
11. A. Moser, K. Rubin, and M. Best, IEEE Trans. Magn. 37, 1872 (2001).
12. R. Wood, IEEE Trans. Magn. 36, 36 (2000).
13. N. Yoshida, M. Yasutake, T. Arie, S. Akita, and Y. Nakayama, Jpn. J. Appl. Phys. 41, 5013 (2002).
14. Z. Liu, Y. Dan, J. Qiu, and Y. Wu, J. Appl. Phys. 91, 8843 (2002).
15. Y. Wu, Y. Shen, Z. Liu, K. Li, and J. Qiu, Appl. Phys. Lett. 82, 1748 (2003).
16. M. Dreyer, R. D. Gomez, and I. D. Mayergoyz, IEEE Trans. Magn. 36, 2975 (2000).
17. A. Volodin, K. Temst, C. Van Haesendonck, and Y. Bruynseraede, Rev. Sci. Instrum. 71, 4468 (2000).
18. H. J. Hug, B. Stiefel, P. J. A. van Schendel, A. Moser, S. Martin, and H.-J. Guntherodt, Rev. Sci. Instrum. 70, 3625 (1999).
19. M. Guggisberg, M. Bammerlin, Ch. Loppacher, O. Pfeiffer, A. Abdurixit, V. Barwich, R. Bennewitz, A. Baratoff, E. Meyer, and H.-J. Guntherodt, Phys. Rev. B 61, 11151 (2000).
20. E. B. Svedberg, S. Khizroev, and D. Litvinov, J. Appl. Phys. 91, 5365 (2002).
21. G. N. Phillips, M. Siekman, L. Abelmann, and J. C. Lodder, Appl. Phys. Lett. 81, 865 (2002).
22. O. Donzelli, D. Palmeri, L. Musa, F. Casoli, F. Albertini, L. Pareti, and G. Turilli, J. Appl. Phys. 93, 9908 (2003).
23. S. Li, W. Zhu, L. Wang, and D. Palmer, J. Appl. Phys. 93, 8531 (2003).
24. H. J. Hug et al., J. Appl. Phys. 83, 5609 (1998).
25. J. Yu, J. Ahner, and D. Weller, Appl. Phys. Lett. 83, 4208 (2003).
26. C. Brucker, T. Nolan, B. Lu, Y. Kubota, M. Plurmer, P. Lu, R. Cronch, C. Chang, D. Chen, J. Chen, R. Michel, G. Parker, and N. Tabat, IEEE Trans. Magn. 39, 673 (2003).
27. G. H. Buh, H. J. Chung, J. H. Yi, I. T. Yoon, and Y. Kuk, J. Appl. Phys. 90, 443 (2001).
28. J. Lohau, S. Kirsch, A. Carl, G. Dumpich, and E. F. Wasserman, J. Appl. Phys. 86, 3410 (1999).