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Volumn 520, Issue 1, 2011, Pages 74-78
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Silicon nanostructures fabricated by Au and SiH4 co-deposition technique using hot-wire chemical vapor deposition
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Author keywords
High resolution transmission electron microscopy; Hot wire chemical vapor deposition; Nanostructures; Optical reflectance; Raman spectroscopy; Silicon; X ray diffraction
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Indexed keywords
CO-DEPOSITION TECHNIQUE;
CRYSTALLINE STRUCTURE;
CRYSTALLINITIES;
HIGH DENSITY;
HIGH DEPOSITION RATES;
HOT WIRE CHEMICAL VAPOR DEPOSITION;
OPTICAL REFLECTANCE;
SI NANOSTRUCTURES;
SILICON NANOSTRUCTURES;
VISIBLE REGION;
CHEMICAL VAPOR DEPOSITION;
COALESCENCE;
CRYSTALLITE SIZE;
DEPOSITION;
RAMAN SPECTROSCOPY;
SILICON;
SURFACE ROUGHNESS;
TRANSMISSION ELECTRON MICROSCOPY;
WIRE;
X RAY DIFFRACTION;
NANOSTRUCTURES;
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EID: 80054033195
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2011.06.042 Document Type: Article |
Times cited : (13)
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References (24)
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