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Journal of Nuclear Materials

Volumn 417, Issue 1-3, 2011, Pages 430-434

Estimation of neutron-irradiation-induced defect in 3C-SiC from change in XRD peak shift and DFT study

(4) Sawabe, Takashi a Akiyoshi, Masafumi b Yoshida, Katsumi c Yano, Toyohiko c

a CENTRAL RESEARCH INSTITUTE OF ELECTRIC POWER INDUSTRY (Japan)

b KYOTO UNIVERSITY (Japan)

c TOKYO INSTITUTE OF TECHNOLOGY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPLEX DEFECTS; DFT CALCULATION; DFT STUDY; DIFFRACTION ANGLE; HIGHER TEMPERATURES; ISOCHRONAL ANNEALING; PEAK SHIFT; XRD; XRD MEASUREMENTS; XRD PEAKS;

DEFECTS; POINT DEFECTS; RIETVELD METHOD; SILICON CARBIDE;

NEUTRON IRRADIATION;

EID: 80053580716 PISSN: 00223115 EISSN: None Source Type: Journal
DOI: 10.1016/j.jnucmat.2010.12.180 Document Type: Conference Paper

Times cited : (53)

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