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Journal of Materials Science: Materials in Electronics

Volumn 22, Issue 11, 2011, Pages 1667-1673

Temperature dependence of the dielectric properties of mesoporous silica films prepared by a sol-gel route in the presence of polyether modified polydimethylsiloxane

(5) Dong, Dong a Wang, Ni a Liu, Xiaobo a Xue, Weidong a Hu, Wencheng a

a UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA (China)

Author keywords

[No Author keywords available]

Indexed keywords

FIELD EMISSION SCANNING ELECTRON MICROSCOPY; MESOPOROUS SILICA FILM; POROUS SILICA FILMS; SIDE-CHAINS; SILICA FILM; SOL-GEL ROUTES; TEMPERATURE DEPENDENCE; TETRA-ETHYL-ORTHO-SILICATE;

ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; DIELECTRIC PROPERTIES; DIFFERENTIAL THERMAL ANALYSIS; ETHERS; FIELD EMISSION MICROSCOPES; FILM PREPARATION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; GELS; SCANNING ELECTRON MICROSCOPY; SILICA; SILICONES; SOL-GELS; SOLS; TEMPERATURE DISTRIBUTION; THERMOGRAVIMETRIC ANALYSIS;

SOL-GEL PROCESS;

EID: 80053345591 PISSN: 09574522 EISSN: 1573482X Source Type: Journal
DOI: 10.1007/s10854-011-0343-8 Document Type: Article

Times cited : (3)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.