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Volumn 12, Issue 22, 2000, Pages 1695-1698

Sol-gel-derived mesoporous silica films with low dielectric constants

Author keywords

[No Author keywords available]

Indexed keywords

AGING OF MATERIALS; DIELECTRIC PROPERTIES; GELATION; HEAT TREATMENT; MICROSTRUCTURE; OLIGOMERS; PERMITTIVITY; POROSITY; SCANNING ELECTRON MICROSCOPY; TEMPERATURE; THERMOGRAVIMETRIC ANALYSIS;

EID: 0034317852     PISSN: 09359648     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-4095(200011)12:22<1695::AID-ADMA1695>3.0.CO;2-V     Document Type: Article
Times cited : (74)

References (17)
  • 2
    • 0342645651 scopus 로고    scopus 로고
    • Eds: A. Lagendijk, H. Treichel, K. J. Uram, A. C. Jones, Materials Research Society, Pittsburgh, PA
    • Low-Dielectric Constant Materials II, Vol. 443 (Eds: A. Lagendijk, H. Treichel, K. J. Uram, A. C. Jones), Materials Research Society, Pittsburgh, PA 1997.
    • (1997) Low-dielectric Constant Materials II , vol.443
  • 15
    • 0343079754 scopus 로고    scopus 로고
    • MS Thesis, University of Washington
    • H. Tian, MS Thesis, University of Washington 1997.
    • (1997)
    • Tian, H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.