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Volumn , Issue , 2011, Pages 2319-2322

Suppression of wear in cyclically loaded polycrystalline silicon MEMS via a thin silicon carbide coating

Author keywords

MEMS; polycrystalline silicon; silicon carbide; solid lubrication; stiction; wear resistance

Indexed keywords

ADHESION FORCES; MICROFABRICATED; PHYSICO-CHEMICALS; POLY-CRYSTALLINE SILICON; POLY-SIC; POLYCRYSTALLINE SIC; POLYCRYSTALLINE SILICON (POLY-SI); SIC COATINGS; SILICON CARBIDE COATINGS; SOLID LUBRICATION; TEST STRUCTURE;

EID: 80052126829     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TRANSDUCERS.2011.5969544     Document Type: Conference Paper
Times cited : (2)

References (18)
  • 1
    • 3943070464 scopus 로고    scopus 로고
    • Critical review: Adhesion in surface micromechanical structures
    • R. Maboudian, R. T. Howe, "Critical Review: Adhesion in surface micromechanical structures", J. Vac. Sci. Technol. B, Vol. 15, 1-20, 1997.
    • (1997) J. Vac. Sci. Technol. B , vol.15 , pp. 1-20
    • Maboudian, R.1    Howe, R.T.2
  • 2
    • 3343016661 scopus 로고    scopus 로고
    • Surface chemistry and tribology of MEMS
    • R. Maboudian, C. Carraro, "Surface chemistry and tribology of MEMS", Annu. Rev. Phys. Chem., Vol. 55, 35-54, 2004.
    • (2004) Annu. Rev. Phys. Chem. , vol.55 , pp. 35-54
    • Maboudian, R.1    Carraro, C.2
  • 3
    • 0031707293 scopus 로고    scopus 로고
    • Surface processes in MEMS technology
    • R. Maboudian, "Surface processes in MEMS technology", Surf. Sci. Rep., Vol. 30, 207-269, 1998.
    • (1998) Surf. Sci. Rep. , vol.30 , pp. 207-269
    • Maboudian, R.1
  • 4
    • 70349679079 scopus 로고    scopus 로고
    • In situ studies of interfacial contact evolution via a 2-axis deflecting cantilever microinstrument
    • F. Liu, I. Laboriante, B. Bush, C.S. Roper, C. Carraro, R. Maboudian, "In situ studies of interfacial contact evolution via a 2-axis deflecting cantilever microinstrument", Appl. Phys. Lett., Vol. 95, 131902, 2009.
    • (2009) Appl. Phys. Lett. , vol.95 , pp. 131902
    • Liu, F.1    Laboriante, I.2    Bush, B.3    Roper, C.S.4    Carraro, C.5    Maboudian, R.6
  • 5
    • 77957845557 scopus 로고    scopus 로고
    • Measurement of adhesion forces between polycrystalline silicon surfaces via a MEMS double-clamped beam test structure
    • G. H. Li, I. Laboriante, F. Liu, M. Shavezipur, B. Bush, C. Carraro, R. Maboudian, "Measurement of adhesion forces between polycrystalline silicon surfaces via a MEMS double-clamped beam test structure", J. Micromech. Microeng., Vol. 20, 095015, 2010.
    • (2010) J. Micromech. Microeng. , vol.20 , pp. 095015
    • Li, G.H.1    Laboriante, I.2    Liu, F.3    Shavezipur, M.4    Bush, B.5    Carraro, C.6    Maboudian, R.7
  • 6
    • 77957843018 scopus 로고    scopus 로고
    • Interfacial adhesion between rough surfaces of polycrystalline silicon and its implications for M/NEMS technology
    • I. Laboriante, B. Bush, D. Lee, F. Liu, T.-J. King-Liu, C. Carraro, R. Maboudian, "Interfacial adhesion between rough surfaces of polycrystalline silicon and its implications for M/NEMS technology", J. Adhes. Sci. Technol., Vol. 24, pp. 2545-2556, 2010.
    • (2010) J. Adhes. Sci. Technol. , vol.24 , pp. 2545-2556
    • Laboriante, I.1    Bush, B.2    Lee, D.3    Liu, F.4    King-Liu, T.-J.5    Carraro, C.6    Maboudian, R.7
  • 7
    • 1842426190 scopus 로고    scopus 로고
    • Single-source chemical vapor deposition of 3C-SiC films in a LPCVD reactor - I. Growth, structure, and chemical characterization
    • M. B. J. Wijesundara, G. Valente, W. R. Ashurst, R. T. Howe, A. P. Pisano, C. Carraro, R. Maboudian, "Single-source chemical vapor deposition of 3C-SiC films in a LPCVD reactor - I. Growth, structure, and chemical characterization", J. Electrochem. Soc., Vol. 151, C210-C214, 2004.
    • (2004) J. Electrochem. Soc. , vol.151
    • Wijesundara, M.B.J.1    Valente, G.2    Ashurst, W.R.3    Howe, R.T.4    Pisano, A.P.5    Carraro, C.6    Maboudian, R.7
  • 8
    • 0033750798 scopus 로고    scopus 로고
    • Silicon carbide as a new MEMS technology
    • P. M. Sarro, "Silicon carbide as a new MEMS technology", Sens. Actuators A, Vol. 82, 210-218, 2000.
    • (2000) Sens. Actuators A , vol.82 , pp. 210-218
    • Sarro, P.M.1
  • 9
    • 0032523974 scopus 로고    scopus 로고
    • Micro/nanotribological studies of polysilicon and SiC films for MEMS applications
    • S. Sundararajan, B. Bhushan, "Micro/ nanotribological studies of polysilicon and SiC films for MEMS applications", Wear, Vol. 217, 251-261, 1998.
    • (1998) Wear , vol.217 , pp. 251-261
    • Sundararajan, S.1    Bhushan, B.2
  • 10
    • 0032183430 scopus 로고    scopus 로고
    • Effect of MEMS-compatible thin film hard coatings on the erosion resistance of silicon micromachined atomizers
    • N. Rajan, C. A. Zorman, M. Mehregany, R. DeAnna, R. J. Harvey, "Effect of MEMS-compatible thin film hard coatings on the erosion resistance of silicon micromachined atomizers", Surf. Coat. Technol., Vol. 108, 391-397, 1998.
    • (1998) Surf. Coat. Technol. , vol.108 , pp. 391-397
    • Rajan, N.1    Zorman, C.A.2    Mehregany, M.3    DeAnna, R.4    Harvey, R.J.5
  • 11
    • 33646402347 scopus 로고    scopus 로고
    • Ultra-thin film encapsulation processes for microelectro-mechanical devices and systems
    • C. R. Stoldt, V. M. Bright, "Ultra-thin film encapsulation processes for microelectro- mechanical devices and systems", J. Phys. D: Appl. Phys., Vol. 39, R163-R170, 2006.
    • (2006) J. Phys. D: Appl. Phys. , vol.39
    • Stoldt, C.R.1    Bright, V.M.2
  • 12
    • 33744919845 scopus 로고    scopus 로고
    • Polycrystalline silicon carbide as a substrate material for reducing adhesion in MEMS
    • D. Gao, C. Carraro, R. T. Howe, R. Maboudian, "Polycrystalline silicon carbide as a substrate material for reducing adhesion in MEMS", Tribol. Lett., Vol. 21, 226-232, 2006.
    • (2006) Tribol. Lett. , vol.21 , pp. 226-232
    • Gao, D.1    Carraro, C.2    Howe, R.T.3    R. Maboudian4
  • 13
    • 77957800647 scopus 로고    scopus 로고
    • Measurement and modeling of adhesion energy between two rough microelectromechanical system (MEMS) surfaces
    • X. J. Xue, A. A. Polycarpou, L M. Phinney, "Measurement and modeling of adhesion energy between two rough microelectromechanical system (MEMS) surfaces", J. Adhes. Sci. Technol., Vol. 22, 429-455, 2008.
    • (2008) J. Adhes. Sci. Technol. , vol.22 , pp. 429-455
    • Xue, X.J.1    Polycarpou, A.A.2    Phinney, L.M.3
  • 14
    • 64849109605 scopus 로고    scopus 로고
    • Competition between strain and chemistry effects on adhesion of Si and SiC
    • Y. Liu, I. Szlufarska, "Competition between strain and chemistry effects on adhesion of Si and SiC", Phys. Rev. B: Condens. Matter, Vol. 79, 094109, 2009.
    • (2009) Phys. Rev. B: Condens. Matter , vol.79 , pp. 094109
    • Liu, Y.1    Szlufarska, I.2
  • 15
    • 33847008682 scopus 로고    scopus 로고
    • Silicon carbide thin films using 1,3-disilabutane single precursor for MEMS applications - A Review
    • C. S. Roper, C. Carraro, R. T. Howe, R. Maboudian, "Silicon carbide thin films using 1,3-disilabutane single precursor for MEMS applications - A Review", ECS Trans., Vol. 3, 267-280, 2006.
    • (2006) ECS Trans. , vol.3 , pp. 267-280
    • Roper, C.S.1    Carraro, C.2    Howe, R.T.3    Maboudian, R.4
  • 18
    • 55449083977 scopus 로고    scopus 로고
    • Micro- and nanomechanical structures for silicon carbide MEMS and NEMS
    • C. A. Zorman, R. J. Parro, "Micro- and nanomechanical structures for silicon carbide MEMS and NEMS", Phys. Status Solidi B, Vol. 245, 1404-1424, 2008.
    • (2008) Phys. Status Solidi B , vol.245 , pp. 1404-1424
    • Zorman, C.A.1    Parro, R.J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.