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Journal of Applied Physics

Volumn 109, Issue 10, 2011, Pages

Effects of SrTiO3/TiO2 buffer layer on structural and electrical properties of BiFeO3 thin films grown on GaN (0002)

(7) Luo, W B a Zhu, J a Zeng, H Z a Liao, X W a Chen, H a Zhang, W L a Li, Y R a

a UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA (China)

Author keywords

[No Author keywords available]

Indexed keywords

BFO FILMS; DOUBLE LAYERS; EPITAXIAL RELATIONSHIPS; POLYCRYSTALLINE FILM; REMNANT POLARIZATIONS; SRTIO; STRUCTURAL AND ELECTRICAL PROPERTIES; THREE ORDERS OF MAGNITUDE; X-RAY DIFFRACTION DATA; XRD;

BUFFER LAYERS; EPITAXIAL FILMS; EPITAXIAL GROWTH; GALLIUM NITRIDE; OPTICAL WAVEGUIDES; PULSED LASER DEPOSITION; STRONTIUM ALLOYS; STRONTIUM TITANATES; TITANIUM DIOXIDE; X RAY DIFFRACTION;

ELECTRIC PROPERTIES;

EID: 79958799768 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3585836 Document Type: Conference Paper

Times cited : (16)

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