Hacking the optical diffraction limit: Review on recent developments of fluorescence nanoscopy

Chinese Science Bulletin

Volumn 56, Issue 18, 2011, Pages 1857-1876

  Ding, Yi Chen ^a   Xi, Peng ^a   Ren, Qiu Shi ^a  

^a PEKING UNIVERSITY   (China)

Author keywords

diffraction limit; fluorescence microscopy; optical nanoscopy

Indexed keywords

EID: 79958067522     PISSN: 10016538     EISSN: 18619541     Source Type: Journal    
DOI: 10.1007/s11434-011-4502-3     Document Type: Review

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