A STED microscope aligned by design

Optics Express

Volumn 17, Issue 18, 2009, Pages 16100-16110

  Wildanger, Dominik ^a   Bückers, Johanna ^a   Westphal, Volker ^a   Hell, Stefan W ^a   Kastrup, Lars ^a  

^a MAX PLANCK INSTITUTE FOR BIOPHYSICAL CHEMISTRY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

OPTICAL CONSTANTS; OPTICS;

DUAL BEAM; EXCITATION BEAMS; MECHANICAL DRIFT; OPTICAL PATH; PHASE PLATE; SINGLE BEAM; SINGLE PATH;

MICROSCOPES;

ARTICLE; CALIBRATION; COMPUTER AIDED DESIGN; EQUIPMENT; EQUIPMENT DESIGN; EVALUATION; FLUORESCENCE MICROSCOPY; GERMANY; IMAGE ENHANCEMENT; INSTRUMENTATION; RAMAN SPECTROMETRY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; STANDARD;

CALIBRATION; COMPUTER-AIDED DESIGN; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; GERMANY; IMAGE ENHANCEMENT; MICROSCOPY, FLUORESCENCE; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; SPECTRUM ANALYSIS, RAMAN;

EID: 69949087441     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.17.016100     Document Type: Article

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