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Volumn 82, Issue 5, 2002, Pages 2775-2783
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Precise nanometer localization analysis for individual fluorescent probes
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Author keywords
[No Author keywords available]
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Indexed keywords
FLUORESCENT DYE;
ACCURACY;
ALGORITHM;
ARTICLE;
MICROSCOPY;
MONTE CARLO METHOD;
PHOTON;
REGRESSION ANALYSIS;
TECHNIQUE;
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EID: 0036231415
PISSN: 00063495
EISSN: None
Source Type: Journal
DOI: 10.1016/S0006-3495(02)75618-X Document Type: Article |
Times cited : (1986)
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References (33)
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