Ti substituted nano-crystalline Cu3N thin films

Journal of Coatings Technology and Research

Volumn 8, Issue 2, 2011, Pages 289-297

  Rahmati, A ^a   Bidadi, H ^a   Ahmadi, K ^b   Hadian, F ^a  

^a UNIVERSITY OF TABRIZ   (Iran)

^b MATERIALS AND ENERGY RESEARCH CENTER   (Iran)

Author keywords

N excess; Quantum size effect; Shallow and deep levels; Ti incorporation

Indexed keywords

COPPER COMPOUNDS; CRYSTALLINE MATERIALS; GRAIN GROWTH; LIGHT ABSORPTION; NITROGEN; THERMODYNAMIC STABILITY; X RAY DIFFRACTION ANALYSIS;

DC MAGNETRON SPUTTERING; DEEP-LEVELS; DIFFRACTION BANDS; DIFFRACTION LINES; MOLECULAR NITROGEN; PHOTOLUMINESCENCE MEASUREMENTS; QUANTUM SIZE EFFECTS; TI-INCORPORATION;

THIN FILMS;

EID: 79958000933     PISSN: 15470091     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11998-010-9279-9     Document Type: Article

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