Growth, structural and optical properties of Cu3N films

Surface Science

Volumn 548, Issue 1-3, 2004, Pages 95-105

  Borsa, D M ^a,b   Boerma, D O ^b  

^a UNIVERSITY OF GRONINGEN   (Netherlands)

^b CENTRO DE MICROANÁLISIS DE MATERIALES   (Spain)

Author keywords

Copper; Ellipsometry; Growth; Insulating films; Molecular beam epitaxy; Nitrides; Nitrogen atom

Indexed keywords

COPPER COMPOUNDS; CRYSTALLIZATION; ELECTRON BEAMS; ELECTRON IRRADIATION; ELLIPSOMETRY; ENERGY GAP; FILM GROWTH; INSULATING MATERIALS; LIGHT ABSORPTION; MAGNESIUM COMPOUNDS; MOLECULAR BEAM EPITAXY; NANOSTRUCTURED MATERIALS; OPTICAL PROPERTIES; OPTICAL RECORDING; STRUCTURE (COMPOSITION); SUBSTRATES;

CRYSTAL QUALITY; EPITAXIAL LAYERS; INSULATING FILMS; OPTICAL GAPS;

THIN FILMS;

EID: 0348042171     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2003.10.053     Document Type: Article

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