Density comparison of isotopically purified silicon single crystals by the pressure-of-flotation method

IEEE Transactions on Instrumentation and Measurement

Volumn 60, Issue 7, 2011, Pages 2539-2543

  Waseda, Atsushi ^a   Fujii, Kenichi ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

Avogadro constant; density measurement; pressure of flotation (PF); silicon

Indexed keywords

AVOGADRO CONSTANT; COMPARISON MEASUREMENT; PRESSURE-OF-FLOTATION; PRESSURE-OF-FLOTATION METHODS; RELATIVE DENSITY; SI CRYSTALS; SILICON CRYSTAL; SILICON SINGLE CRYSTALS;

DIFFRACTIVE OPTICS; FLOTATION; PURIFICATION;

SINGLE CRYSTALS;

EID: 79953673474     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2011.2114070     Document Type: Article

References (8)

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