Investigations on diameter measurements of the Avogadro silicon sphere dependent on the position in the field of view of the interferometer optics

IEEE Transactions on Instrumentation and Measurement

Volumn 58, Issue 4, 2009, Pages 919-923

  Bartl, Guido ^a   Nicolaus, R Arnold ^a  

^a PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

Author keywords

Avogadro constant; Diameter; Fizeau interferometer; Interferometry; Silicon sphere

Indexed keywords

INTERFEROMETERS; LASER OPTICS; NONMETALS; SILICON WAFERS; SINGLE CRYSTALS; SPHERES; VOLUME MEASUREMENT;

ABSOLUTE INTERFEROMETRIES; AVOGADRO CONSTANT; DIAMETER; DIAMETER MEASUREMENTS; EXPERIMENTAL SET-UP; FIELD OF VIEWS; FIZEAU INTERFEROMETER; GERMANY; HIGH PRECISION; INFLUENCING PARAMETERS; LATTICE PARAMETERS; MEASUREMENT STRATEGIES; OPTICAL COMPONENTS; PHYSIKALISCH-TECHNISCHE BUNDESANSTALT; PROJECT PARTNERS; SILICON SINGLE CRYSTALS;

INTERFEROMETRY;

EID: 63449087499     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2008.2007057     Document Type: Conference Paper

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