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Volumn 54, Issue 2, 2005, Pages 872-876

Diameter determination of Avogadro spheres #1 and #2

Author keywords

Absolute density; Avogadro's constant; Silicon crystal; Spheres interferometer; Volume

Indexed keywords

DENSITY MEASUREMENT (SPECIFIC GRAVITY); INTERFEROMETERS; INTERFEROMETRY; SILICON; SINGLE CRYSTALS; SPHERES;

EID: 17444371668     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2005.843527     Document Type: Article
Times cited : (13)

References (8)
  • 2
    • 0031122760 scopus 로고    scopus 로고
    • "A novel interferometer for dimensional measurement of a silicon sphere"
    • Apr
    • R. A. Nicolaus and G. Bönsch, "A novel interferometer for dimensional measurement of a silicon sphere," IEEE Trans. Instrum. Meas., vol. 46, no. 2, pp. 563-565, Apr. 1997.
    • (1997) IEEE Trans. Instrum. Meas. , vol.46 , Issue.2 , pp. 563-565
    • Nicolaus, R.A.1    Bönsch, G.2
  • 3
    • 14644397455 scopus 로고    scopus 로고
    • "Accurate measurement of silicon spheres by interferometry"
    • G. Delbressine, G. Schellekens, G. Homburg, and G. Haitjema, Eds., Eindhoven, The Netherlands
    • R. A. Nicolaus and G. Bönsch, "Accurate measurement of silicon spheres by interferometry," in Proc. 3rd EuSPEN Int. Conf., vol. 2, G. Delbressine, G. Schellekens, G. Homburg, and G. Haitjema, Eds., Eindhoven, The Netherlands, 2002, pp. 545-548.
    • (2002) Proc. 3rd EuSPEN Int. Conf. , vol.2 , pp. 545-548
    • Nicolaus, R.A.1    Bönsch, G.2
  • 5
    • 0001422689 scopus 로고    scopus 로고
    • "Tunable 633 nm diode lasers and application for phase stepping interferometry"
    • P. McKeown et al., Eds., Aachen, Germany
    • F. Imkenberg, R. A. Nicolaus, and A. Abou-Zeid et al., "Tunable 633 nm diode lasers and application for phase stepping interferometry," in Proc. 1st Int. EuSPEN Conf.: Precision Engineering-Nanotechnology vol. 2, P. McKeown et al., Eds., Aachen, Germany, 1999, pp. 243-246.
    • (1999) Proc. 1st Int. EuSPEN Conf.: Precision Engineering-Nanotechnology , vol.2 , pp. 243-246
    • Imkenberg, F.1    Nicolaus, R.A.2    Abou-Zeid, A.3
  • 6
    • 0027687190 scopus 로고
    • "Precise method to determining systematic errors in phase-shifting interferometry on Fizeau interferences"
    • R. A Nicolaus, "Precise method to determining systematic errors in phase-shifting interferometry on Fizeau interferences," Appl. Opt. vol. 32, pp. 6380-6386, 1993.
    • (1993) Appl. Opt. , vol.32 , pp. 6380-6386
    • Nicolaus, R.A.1
  • 8
    • 17444406422 scopus 로고    scopus 로고
    • "Test Rep. Mass of Avo2"
    • M. Borys, "Test Rep. Mass of Avo2,".
    • Borys, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.