Influence of the distribution of measuring points on the mean diameter determination of the Avogadro project's silicon spheres

Measurement Science and Technology

Volumn 20, Issue 6, 2009, Pages

  Bartl, Guido ^a   Nicolaus, Arnold ^a  

^a PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

Author keywords

Avogadro constant; Diameter; Gridding; Interferometry; Silicon sphere; Sphere interferometer

Indexed keywords

INTERFEROMETERS; INTERFEROMETRY; LASER OPTICS; SILICON; SILICON WAFERS; SINGLE CRYSTALS;

ABSOLUTE INTERFEROMETRY; AVOGADRO CONSTANT; DIAMETER; FIZEAU INTERFEROMETERS; GRIDDING; MEASUREMENT POSITIONS; RELATIVE UNCERTAINTY; SILICON SINGLE CRYSTALS;

SPHERES;

EID: 70350674345     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/20/6/065104     Document Type: Article

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