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Physical Review B - Condensed Matter and Materials Physics

Volumn 79, Issue 13, 2009, Pages

Scanning gate microscopy measurements on a superconducting single-electron transistor

(9) Huefner, M a May, C a Kicin S a Ensslin, K a Ihn, T a Hilke, M b Suter, K c De Rooij, N F c Staufer, U d

a ETH ZURICH (Switzerland)

b MCGILL UNIVERSITY (Canada)

c EPFL (Switzerland)

d DELFT UNIVERSITY OF TECHNOLOGY (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 66349092781 PISSN: 10980121 EISSN: 1550235X Source Type: Journal
DOI: 10.1103/PhysRevB.79.134530 Document Type: Article

Times cited : (31)

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