-
1
-
-
53749099094
-
-
10.1063/1.2988894
-
C. J. Neufeld, N. G. Toledo, S. C. Cruz, M. Iza, S. P. DenBaars, and U. K. Mishra, Appl. Phys. Lett. 93, 143502 (2008). 10.1063/1.2988894
-
(2008)
Appl. Phys. Lett.
, vol.93
, pp. 143502
-
-
Neufeld, C.J.1
Toledo, N.G.2
Cruz, S.C.3
Iza, M.4
Denbaars, S.P.5
Mishra, U.K.6
-
2
-
-
34848905285
-
Design and characterization of GaNInGaN solar cells
-
DOI 10.1063/1.2793180
-
O. Jani, I. Ferguson, C. Honsberg, and S. Kurtz, Appl. Phys. Lett. 91, 132117 (2007). 10.1063/1.2793180 (Pubitemid 47502577)
-
(2007)
Applied Physics Letters
, vol.91
, Issue.13
, pp. 132117
-
-
Jani, O.1
Ferguson, I.2
Honsberg, C.3
Kurtz, S.4
-
3
-
-
77949690503
-
-
10.1063/1.3330876
-
H. W. Seo, L. W. Tu, Q. Y. Chen, C. Y. Ho, Y. T. Lin, K. L. Wu, D. J. Jang, D. P. Norman, and N. J. Ho, Appl. Phys. Lett. 96, 101114 (2010). 10.1063/1.3330876
-
(2010)
Appl. Phys. Lett.
, vol.96
, pp. 101114
-
-
Seo, H.W.1
Tu, L.W.2
Chen, Q.Y.3
Ho, C.Y.4
Lin, Y.T.5
Wu, K.L.6
Jang, D.J.7
Norman, D.P.8
Ho, N.J.9
-
4
-
-
79952156505
-
-
10.10022Fpssc.200778728
-
C. Thomidis, A. Y. Nikiforov, T. Xu, and T. D. Moustakas, Phys. Status Solidi. C 5, 2301 (2008). 10.10022Fpssc.200778728
-
(2008)
Phys. Status Solidi. C
, vol.5
, pp. 2301
-
-
Thomidis, C.1
Nikiforov, A.Y.2
Xu, T.3
Moustakas, T.D.4
-
5
-
-
35548994514
-
High responsivity of GaN p-i-n photodiode by using low-temperature interlayer
-
DOI 10.1063/1.2800813
-
J. C. Lin, Y. K. Su, S. J. Chang, W. H. Lan, K. C. Huang, W. R. Chen, C. Y. Huang, W. C. Lai, W. J. Lin, and Y. C. Cheng, Appl. Phys. Lett. 91, 173502 (2007). 10.1063/1.2800813 (Pubitemid 350015294)
-
(2007)
Applied Physics Letters
, vol.91
, Issue.17
, pp. 173502
-
-
Lin, J.C.1
Su, Y.K.2
Chang, S.J.3
Lan, W.H.4
Huang, K.C.5
Chen, W.R.6
Huang, C.Y.7
Lai, W.C.8
Lin, W.J.9
Cheng, Y.C.10
-
8
-
-
33746836077
-
Effect of threading dislocation density on Ni/n-GaN Schottky diode I-V characteristics
-
DOI 10.1063/1.2219985
-
A. R. Arehart, B. Moran, J. S. Speck, U. K. Mishra, S. P. DenBaars, and S. A. Ringel, J. Appl. Phys. 100, 023709 (2006). 10.1063/1.2219985 (Pubitemid 44179557)
-
(2006)
Journal of Applied Physics
, vol.100
, Issue.2
, pp. 023709
-
-
Arehart, A.R.1
Moran, B.2
Speck, J.S.3
Mishra, U.K.4
DenBaars, S.P.5
Ringel, S.A.6
-
9
-
-
70350106745
-
-
10.1063/1.3236647
-
K. Cinar, N. Yildirim, C. Coskun, and A. Turut, J. Appl. Phys. 106, 073717 (2009). 10.1063/1.3236647
-
(2009)
J. Appl. Phys.
, vol.106
, pp. 073717
-
-
Cinar, K.1
Yildirim, N.2
Coskun, C.3
Turut, A.4
-
10
-
-
67650721227
-
-
10.1063/1.3158058
-
Y. J. Lin, J. Appl. Phys. 106, 013702 (2009). 10.1063/1.3158058
-
(2009)
J. Appl. Phys.
, vol.106
, pp. 013702
-
-
Lin, Y.J.1
-
11
-
-
37149029094
-
Barrier inhomogeneity and electrical properties of PtGaN Schottky contacts
-
DOI 10.1063/1.2817647
-
F. Lucolano, F. Roccaforte, F. Giannazzo, and V. Raineri, J. Appl. Phys. 102, 113701 (2007). 10.1063/1.2817647 (Pubitemid 350262098)
-
(2007)
Journal of Applied Physics
, vol.102
, Issue.11
, pp. 113701
-
-
Iucolano, F.1
Roccaforte, F.2
Giannazzo, F.3
Raineri, V.4
-
12
-
-
21544480777
-
-
10.1063/1.110417
-
P. Hacke, T. Detchprohm, K. Hiramatsu, and N. Sawaki, Appl. Phys. Lett. 63, 2676 (1993). 10.1063/1.110417
-
(1993)
Appl. Phys. Lett.
, vol.63
, pp. 2676
-
-
Hacke, P.1
Detchprohm, T.2
Hiramatsu, K.3
Sawaki, N.4
-
13
-
-
36849050162
-
Conduction band offset at the InNGaN heterojunction
-
DOI 10.1063/1.2821378
-
K. Wang, C. Lian, N. Su, D. Jena, and J. Timler, Appl. Phys. Lett. 91, 232117 (2007). 10.1063/1.2821378 (Pubitemid 350234462)
-
(2007)
Applied Physics Letters
, vol.91
, Issue.23
, pp. 232117
-
-
Wang, K.1
Lian, C.2
Su, N.3
Jena, D.4
Timler, J.5
-
14
-
-
27844513507
-
Schottky behavior at InN-GaN interface
-
DOI 10.1063/1.2132538, 212111
-
N. C. Chen, P. H. Chang, Y. N. Wang, H. C. Peng, W. C. Lien, C. F. Shih, Chin -An Chang, and G. M. Wu, Appl. Phys. Lett. 87, 212111 (2005). 10.1063/1.2132538 (Pubitemid 41643368)
-
(2005)
Applied Physics Letters
, vol.87
, Issue.21
, pp. 1-3
-
-
Chen, N.C.1
Chang, P.H.2
Wang, Y.N.3
Peng, H.C.4
Lien, W.C.5
Shih, C.F.6
Chang, C.-A.7
Wu, G.M.8
-
17
-
-
25444474711
-
Interfacial structure of MBE grown InN on GaN
-
DOI 10.1002/pssa.200461343
-
T. Kehagias, E. Iliopoulos, A. Delimitis, G. Nouet, E. Dimakis, A. Georgakilas, and Ph. Komninou, Phys. Stat. Sol. A 202, 777 (2005). 10.1002/pssa.200461343 (Pubitemid 41371966)
-
(2005)
Physica Status Solidi (A) Applications and Materials
, vol.202
, Issue.5
, pp. 777-780
-
-
Kehagias, Th.1
Iliopoulos, E.2
Delimitis, A.3
Nouet, G.4
Dimakis, E.5
Georgakilas, A.6
Komninou, Ph.7
-
18
-
-
0000610808
-
High barrier height GaN Schottky diodes: Pt/GaN and Pd/GaN
-
DOI 10.1063/1.115948, PII S0003695196009096
-
L. Wang, M. I. Nathan, T. Lim, M. A. Khan, and Q. Chen, Appl. Phys. Lett. 68, 1267 (1996). 10.1063/1.115948 (Pubitemid 126684152)
-
(1996)
Applied Physics Letters
, vol.68
, Issue.9
, pp. 1267-1269
-
-
Wang, L.1
Nathan, M.I.2
Lim, T.-H.3
Khan, M.A.4
Chen, Q.5
-
21
-
-
0037074868
-
Schottky barrier inhomogeneities at contacts to carbon-containing silicon/germanium alloys
-
DOI 10.1016/S0921-5107(01)00800-5, PII S0921510701008005
-
A. Hattab, J. L. Perrossier, F. Meyer, M. Barthula, H. J. Osten, and J. Griesche, Mat. Sci. Eng. B 89, 284 (2002). 10.1016/S0921-5107(01)00800-5 (Pubitemid 34100168)
-
(2002)
Materials Science and Engineering B: Solid-State Materials for Advanced Technology
, vol.89
, Issue.1-3
, pp. 284-287
-
-
Hattab, A.1
Perrossier, J.L.2
Meyer, F.3
Barthula, M.4
Osten, H.J.5
Griesche, J.6
-
22
-
-
34547399962
-
Determination of the lateral barrier height of inhomogeneous Au/n-type InP/In Schottky barrier diodes
-
DOI 10.1088/0268-1242/22/8/003, PII S0268124207439700, 003
-
F. E. Cimilli, M. Saglam, and A. Turut, Semicond. Sci. Technol. 22, 851 (2007). 10.1088/0268-1242/22/8/003 (Pubitemid 47160518)
-
(2007)
Semiconductor Science and Technology
, vol.22
, Issue.8
, pp. 851-854
-
-
Cimilli, F.E.1
Salam, M.2
Turut, A.3
-
24
-
-
56249102431
-
-
10.1063/1.3013838
-
H. Kim, J. Ryou, R. D. Dupuis, S. N. Lee, Y. Park, J. Weon, and T. Y. Seong, Appl. Phys. Lett. 93, 192106 (2008). 10.1063/1.3013838
-
(2008)
Appl. Phys. Lett.
, vol.93
, pp. 192106
-
-
Kim, H.1
Ryou, J.2
Dupuis, R.D.3
Lee, S.N.4
Park, Y.5
Weon, J.6
Seong, T.Y.7
-
25
-
-
32244447212
-
Photoluminescence of plasma enhanced chemical vapor deposition amorphous silicon oxide with silicon nanocrystals grown at different fluence ratios and substrate temperatures
-
DOI 10.1143/JJAP.45.1040
-
Y. J. Lin, W. X. Lin, C. T. Lee, and H. C. Chang, Jpn. J. Appl. Phys. Part 1, 45, 2505 (2006). 10.1143/JJAP.45.1040 (Pubitemid 43213415)
-
(2006)
Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
, vol.45
, Issue.A2
, pp. 1040-1043
-
-
Lin, C.-J.1
Lin, C.-K.2
Chang, C.-W.3
Chueh, Y.-L.4
Kuo, H.-C.5
Diau, E.W.-G.6
Chou, L.-J.7
Lin, G.-R.8
-
26
-
-
17944376214
-
Application of the thermionic field emission model in the study of a Schottky barrier of Ni on p-GaN from current-voltage measurements
-
DOI 10.1063/1.1890476, 122109
-
Y. J. Lin, Appl. Phys. Lett. 86, 122109 (2005). 10.1063/1.1890476 (Pubitemid 40596910)
-
(2005)
Applied Physics Letters
, vol.86
, Issue.12
, pp. 1-3
-
-
Lin, Y.-J.1
-
27
-
-
63749123493
-
-
10.1088/0022-3727/42/7/075308
-
Y. J. Lin, S. S. Chang, H. C. Chang, and Y. C. Liu, J. Phys. D: Appl. Phys. 42, 075308 (2009). 10.1088/0022-3727/42/7/075308
-
(2009)
J. Phys. D: Appl. Phys.
, vol.42
, pp. 075308
-
-
Lin, Y.J.1
Chang, S.S.2
Chang, H.C.3
Liu, Y.C.4
-
28
-
-
33749252157
-
Schottky barrier height of boride-based rectifying contacts to p-GaN
-
DOI 10.1063/1.2357855
-
L. Stafford, L. F. Voss, S. J. Pearton, J. J. Chen, and F. Ren, Appl. Phys. Lett. 89, 132110 (2006). 10.1063/1.2357855 (Pubitemid 44484103)
-
(2006)
Applied Physics Letters
, vol.89
, Issue.13
, pp. 132110
-
-
Stafford, L.1
Voss, L.F.2
Pearton, S.J.3
Chen, J.-J.4
Ren, F.5
-
29
-
-
34249067499
-
5-based rectifying contacts to p-GaN
-
DOI 10.1007/s11664-006-0054-8
-
L. F. Voss, L. Stafford, G. T. Thaler, C. R. Abernathy, S. J. Pearton, J. J. Chen, and F. Ren, J. Electron. Mater. 36, 384 (2007). 10.1007/s11664-006- 0054-8 (Pubitemid 46782221)
-
(2007)
Journal of Electronic Materials
, vol.36
, Issue.4
, pp. 384-390
-
-
Voss, L.F.1
Stafford, L.2
Thaler, G.T.3
Abernathy, C.R.4
Pearton, S.J.5
Chen, J.-J.6
Ren, F.7
-
30
-
-
0035834318
-
-
10.1016/S0927-796X(01)00037-7
-
R. T. Tung, Mater. Sci. Eng. R, 35, 1 (2001). 10.1016/S0927-796X(01) 00037-7
-
(2001)
Mater. Sci. Eng. R
, vol.35
, pp. 1
-
-
Tung, R.T.1
|