Photoelectron spectroscopic investigation of InN and InN/GaN heterostructures

Thin Solid Films

Volumn 516, Issue 15, 2008, Pages 5016-5019

  Shih, C F ^a   Chen, N C ^b   Tseng, C Y ^b  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

^b CHANG GUNG UNIVERSITY   (Taiwan)

Author keywords

Indium nitride; Metal organic chemical vapor deposition; Schottky barrier; X ray photoelectron spectroscopy

Indexed keywords

EID: 42649093163     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2008.01.016     Document Type: Letter

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