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Volumn 10, Issue 3, 2009, Pages 459-464
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Effect of fabrication process on the microstructure and the efficiency of organic light-emitting diode
c
ULVAC PHI Inc
(Japan)
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Author keywords
C60 cluster ion beam; Organic light emitting diode; Secondary ion mass spectrometry (SIMS); X ray photoelectron spectrometry (XPS)
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Indexed keywords
COATINGS;
EFFICIENCY;
ELECTRONIC EQUIPMENT;
EVAPORATION;
FABRICATION;
ION BEAMS;
IONS;
MICROSTRUCTURE;
PHOTOELECTRONS;
PHOTONS;
SECONDARY EMISSION;
SECONDARY ION MASS SPECTROMETRY;
X RAY PHOTOELECTRON SPECTROSCOPY;
X RAYS;
CARRIER INJECTION;
CARRIER TRANSPORTATION;
CLUSTER ION BEAMS;
CONCENTRATION GRADIENTS;
FABRICATION PROCESS;
MOLECULAR DISTRIBUTION;
MOLECULAR ORGANIC LIGHT-EMITTING DIODES;
X-RAY PHOTOELECTRON SPECTROMETRIES;
ORGANIC LIGHT EMITTING DIODES (OLED);
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EID: 62649135960
PISSN: 15661199
EISSN: None
Source Type: Journal
DOI: 10.1016/j.orgel.2009.01.013 Document Type: Article |
Times cited : (33)
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References (23)
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