Migration of small molecules during the degradation of organic light-emitting diodes

Organic Electronics

Volumn 10, Issue 4, 2009, Pages 581-586

  Lin, Wei Chun ^a   Wang, Wei Ben ^b   Lin, Yu Chin ^a   Yu, Bang Ying ^a   Chen, Ying Yu ^a   Hsu, Mao Feng ^b   Jou, Jwo Huei ^b   Shyue, Jing Jong ^a,c  

^a RESEARCH CENTER FOR APPLIED SCIENCES   (Taiwan)

^b NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^c NATIONAL TAIWAN UNIVERSITY   (Taiwan)

Author keywords

C60 cluster ion beam; Degradation; Migration; Organic light emitting diode; X ray photoelectron spectrometry (XPS)

Indexed keywords

CONDUCTING POLYMERS; DEGRADATION; ELECTRODES; ION BEAMS; IRIDIUM COMPOUNDS; MOLECULES; PHOTODEGRADATION; PHOTOELECTRONS; PHOTONS; STYRENE; X RAY PHOTOELECTRON SPECTROSCOPY;

CLUSTER ION BEAMS; ELEMENTAL DEPTH PROFILES; ELEMENTAL DISTRIBUTION; ETHYLENEDIOXYTHIOPHENES; MIGRATION; ORGANIC LIGHT EMITTING DIODES(OLEDS); POLYSTYRENE SULFONIC ACID; X-RAY PHOTOELECTRON SPECTROMETRIES;

ORGANIC LIGHT EMITTING DIODES (OLED);

EID: 67349091752     PISSN: 15661199     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.orgel.2009.02.012     Document Type: Article

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