Three-dimensional nanoscale imaging of polymer bulk-heterojunction by scanning electrical potential microscopy and C60+ cluster ion slicing

Analytical Chemistry

Volumn 81, Issue 21, 2009, Pages 8936-8941

  Yu, Bang Ying ^a,b   Lin, Wei Chun ^a   Huang, Jen Hsien ^b   Chu, Chih Wei ^a,c   Lin, Yu Chin ^a   Kuo, Che Hung ^b   Lee, Szu Hsian ^b   Wong, Ken Tseng ^b   Ho, Kuo Chuan ^b   Shyue, Jing Jong ^a,b  

^a RESEARCH CENTER FOR APPLIED SCIENCES   (Taiwan)

^b NATIONAL TAIWAN UNIVERSITY   (Taiwan)

^c NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE LAYER; BULK HETEROJUNCTION; BULK-HETEROJUNCTIONS; BUTYRIC ACIDS; CARRIER TRANSPORTATION; CLUSTER ION BEAMS; CLUSTER IONS; CONTACT POTENTIAL; EFFECTIVE TOOL; ELECTRICAL POTENTIAL; HIGHEST OCCUPIED MOLECULAR ORBITAL; METHYL ESTERS; NANO-SCALE IMAGING; POLY (3-HEXYLTHIOPHENE); POLYMER BULK; PROCESSABLE; SOFT MATERIAL; STRONG CONTRAST; SURFACE DISTRIBUTIONS; TWO-COMPONENT; VOLUME IMAGE;

ESTERS; FATTY ACIDS; FULLERENES; HETEROJUNCTIONS; IONS; MOLECULAR ORBITALS; PHASE SEPARATION; PHOTOVOLTAIC CELLS; SURFACES;

THREE DIMENSIONAL;

[6,6]PHENYL C61 BUTYRIC ACID METHYL ESTER; NANOMATERIAL; POLY(3 HEXYLTHIOPHENE); POLYMER; UNCLASSIFIED DRUG;

ARTICLE; CHEMICAL STRUCTURE; ELECTRIC POTENTIAL; ENERGY; IMAGE ANALYSIS; NANOANALYSIS; NANOIMAGING; ORBIT; PHASE SEPARATION; SCANNING ELECTRICAL POTENTIAL MICROSCOPY; SURFACE PROPERTY; THREE DIMENSIONAL IMAGING;

EID: 70350639291     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac901588t     Document Type: Article

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