SCOPUS 정보 검색 플랫폼

Volumn 80, Issue 9, 2008, Pages 3412-3415

Depth profiling of organic films with X-ray photoelectron spectroscopy using C60+ and Ar+ Co-sputtering

(10) Yu, Bang Ying a Chen, Ying Yu a Wang, Wei Ben b Hsu, Mao Feng b Tsai, Shu Ping a Lin, Wei Chun a Lin, Yu Chin a Jou, Jwo Huei b Chu, Chih Wei a Shyue, Jing Jong a,c

a RESEARCH CENTER FOR APPLIED SCIENCES (Taiwan)

b NATIONAL TSING HUA UNIVERSITY (Taiwan)

c NATIONAL TAIWAN UNIVERSITY (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL ANALYSIS; SOLAR CELLS; SPUTTERING; X RAY PHOTOELECTRON SPECTROSCOPY;

NONCONSTANT SPUTTERING; ORGANIC FILMS; ORGANIC THIN-FILM DEVICES;

THIN FILMS;

ARGON; CARBON; FULLERENE; MOLECULAR LAYER; ORGANIC COMPOUND;

ARTICLE; ATOM; CHEMICAL COMPOSITION; CHEMICAL STRUCTURE; FILM; ION CURRENT; ION THERAPY; LIGHT EMITTING DIODE; PROCESSING; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 42949161069 PISSN: 00032700 EISSN: None Source Type: Journal
DOI: 10.1021/ac702626n Document Type: Article

Times cited : (61)

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