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Volumn 134, Issue 5, 2009, Pages 945-951

Sputter-induced chemical transformation in oxoanions by combination of C60+ and Ar+ ion beams analyzed with X-ray photoelectron spectrometry

(6) Lin, Yu Chin a Chen, Ying Yu a Yu, Bang Ying a Lin, Wei Chun a Kuo, Che Hung a,b Shyue, Jing Jong a,b

a RESEARCH CENTER FOR APPLIED SCIENCES (Taiwan)

b NATIONAL TAIWAN UNIVERSITY (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ANION; ARGON; CARBON; CARBONIC ACID; CHLORATE; FULLERENE; INORGANIC SALT; NITRATE; PERCHLORATE; PHOSPHATE; SODIUM CHLORITE; THIOSULFATE;

ARTICLE; CHEMICAL REACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 65349190618 PISSN: 00032654 EISSN: 13645528 Source Type: Journal
DOI: 10.1039/b814729a Document Type: Article

Times cited : (44)

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