X-ray photoelectron spectrometry depth profiling of organic thin films using C60 sputtering

Analytical Chemistry

Volumn 80, Issue 2, 2008, Pages 501-505

  Chen, Ying Yu ^a   Yu, Bang Ying ^a   Wang, Wei Ben ^b   Hsu, Mao Feng ^b   Lin, Wei Chun ^a   Lin, Yu Chin ^a   Jou, Jwo Huei ^b   Shyue, Jing Jong ^a,c  

^a RESEARCH CENTER FOR APPLIED SCIENCES   (Taiwan)

^b NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^c NATIONAL TAIWAN UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

MULTILAYER STRUCTURE; ORGANIC THIN FILMS;

CARBON; ION BEAMS; ORGANIC LIGHT EMITTING DIODES (OLED); SPUTTERING; X RAY PHOTOELECTRON SPECTROSCOPY;

THIN FILMS;

2,2',2'' (1,3,5 BENZINETRIYL)TRIS(1 PHENYL 1H BENZIMIDAZOLE); BENZIMIDAZOLE DERIVATIVE; BIPHENYL DERIVATIVE; FULLERENE; ORGANIC COMPOUND; POLY(ETHYLENEDIOXYTHIOPHENE); POLYSTYRENESULFONIC ACID; THIOPHENE DERIVATIVE; UNCLASSIFIED DRUG;

ARTICLE; CHEMICAL COMPOSITION; CHEMICAL STRUCTURE; FILM; IMPLANTATION; LIGHT EMITTING DIODE; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 38349140657     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac701899a     Document Type: Article

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