Aging analysis at gate and macro cell level

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD

Volumn , Issue , 2010, Pages 77-84

  Lorenz, Dominik ^a   Barke, Martin ^a   Schlichtmann, Ulf ^a  

^a TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED DESIGN;

AGING EFFECTS; MACRO CELLS; PERFORMANCE DEGRADATION; RELIABILITY COSTS; TIME-DEPENDENT VARIABILITIES;

MACROS;

EID: 78650924021     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICCAD.2010.5654309     Document Type: Conference Paper

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