Temperature-aware NBTI modeling and the impact of input vector control on performance degradation

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2007, Pages 546-551

  Wang, Yu ^a   Luo, Hong ^a   He, Ku ^a   Luo, Rong ^a   Yang, Huazhong ^a   Xie, Yuan ^b  

^a TSINGHUA UNIVERSITY   (China)

^b PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; LEAKAGE CURRENTS; THRESHOLD VOLTAGE;

MINIMUM LEAKAGE VECTORS; NEGATIVE BIAS TEMPERATURE INSTABILITY (NBTI);

DIGITAL CIRCUITS;

EID: 34548312037     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2007.364650     Document Type: Conference Paper

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