Aging analysis of circuit timing considering NBTI and HCI

2009 15th IEEE International On-Line Testing Symposium, IOLTS 2009

Volumn , Issue , 2009, Pages 3-8

  Lorenz, Dominik ^a   Georgakos, Georg ^b   Schlichtmann, Ulf ^a  

^a TECHNICAL UNIVERSITY OF MUNICH   (Germany)

^b INFINEON TECHNOLOGIES AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AGING EFFECTS; CIRCUIT TIMING; GATE LEVELS; GATE MODELS; KNOWLEDGE IT;

DEGRADATION; DIGITAL INTEGRATED CIRCUITS; ELECTRIC CURRENTS; NEGATIVE TEMPERATURE COEFFICIENT; THERMODYNAMIC STABILITY; TIME MEASUREMENT;

TIMING CIRCUITS;

EID: 70449424330     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IOLTS.2009.5195975     Document Type: Conference Paper

References (16)

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