Reliable systems on unreliable fabrics

IEEE Design and Test of Computers

Volumn 25, Issue 4, 2008, Pages 322-332

  Austin, Todd ^a   Bertacco, Valeria ^a   Mahlke, Scott ^a   Cao, Yu ^b  

^a UNIVERSITY OF MICHIGAN   (United States)

^b ARIZONA STATE UNIVERSITY   (United States)

Author keywords

Degradation; Fabrication; Fault modeling research; GSRC; Integrated circuit reliability; Reliability; Reliability engineering; Reliability stress reduction; Reliable systems; Resilient System Design Team; Silicon; Silicon fabrication technologies; Stress; Unreliable fabrics

Indexed keywords

CHLORINE COMPOUNDS; ERROR CORRECTION; NONMETALS; OPTICAL DESIGN; RELIABILITY; SILICON; SYSTEMS ANALYSIS;

ACTIVE FAULTING; COST SOLUTIONS; DEGRADATION; DESIGN CHALLENGES; FABRICATION; FABRICATION TECHNOLOGIES; FAULT-MODELING RESEARCH; FAULTY SYSTEMS; FUTURE DESIGNS; GSRC; INTEGRATED CIRCUIT RELIABILITY; RELIABILITY ENGINEERING; RELIABILITY STRESS REDUCTION; RELIABLE SYSTEMS; RESILIENT-SYSTEM DESIGN TEAM; SILICON FABRICATION TECHNOLOGIES; SILICON FABRICATION TECHNOLOGY; SOFT ERRORS; STRESS; STRESS REDUCTION; SYSTEM DESIGNS; SYSTEM OPERATIONS; SYSTEMS RESEARCH; TECHNOLOGY NODES; UNRELIABLE FABRICS;

TECHNOLOGY;

EID: 49549119735     PISSN: 07407475     EISSN: None     Source Type: Journal    
DOI: 10.1109/MDT.2008.107     Document Type: Article

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