Structural and sensing characteristics of Dy2O3 and Dy2TiO5 electrolyte-insulator-semiconductor pH sensors

Journal of Physical Chemistry C

Volumn 114, Issue 41, 2010, Pages 17914-17919

  Pan, Tung Ming ^a   Lin, Chao Wen ^a  

^a CHANG GUNG UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

BUFFER SOLUTIONS; DRIFT RATES; ELECTROLYTE-INSULATOR-SEMICONDUCTOR; ENGINEERING APPLICATIONS; HYSTERESIS VOLTAGE; INTERFACIAL LAYER; MORPHOLOGICAL FEATURES; REACTIVE RADIO FREQUENCY SPUTTERING; SENSING CHARACTERISTICS; SENSING FILMS; SENSING MEMBRANES; SI SUBSTRATES; TIO;

AMORPHOUS FILMS; ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; BIOMEDICAL ENGINEERING; ELECTROLYTES; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR SWITCHES; SPUTTERING; SURFACE ROUGHNESS; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

CRYSTAL ATOMIC STRUCTURE;

EID: 77957979818     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp107733u     Document Type: Article

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