Temperature dependence of energy dissipation on NaCl(001) in non-contact atomic force microscopy

Nanotechnology

Volumn 21, Issue 34, 2010, Pages

  Langewisch, G ^a   Fuchs, H ^a   Schirmeisen, A ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

DYNAMIC FORCE SPECTROSCOPY; NONCONTACT ATOMIC FORCE MICROSCOPY; REPULSIVE FORCES; SAMPLE TEMPERATURE; SILICON TIPS; SYSTEMATIC VARIATION; TEMPERATURE DEPENDENCE; TIP-SAMPLE INTERACTION;

ATOMIC FORCE MICROSCOPY; ELECTRON ENERGY LOSS SPECTROSCOPY; ENERGY DISSIPATION; ENERGY DISSIPATORS;

SODIUM CHLORIDE;

EID: 77957835492     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/21/34/345703     Document Type: Article

References (41)

1. Binnig G, Quate C F and Gerber Ch 1986 Atomic force microscope Phys. Rev. Lett. 56 930-3
2. Giessibl F J 1995 Atomic resolution of the silicon (111)-(7 × 7) surface by atomic force microscopy Science 267 68-71
3. Sugawara Y, Ohta M, Ueyama H and Morita S 1995 Defect motion on an InP(110) surface observed with noncontact atomic force microscopy Science 270 1646-8
4. Morita S, Wiesendanger R and Meyer E 2002 Noncontact Atomic Force Microscopy (Berlin: Springer)
5. Garcia R and Perez R 2002 Dynamic atomic force microscopy methods Surf. Sci. Rep. 47 197-301
6. Giessibl F J 2003 Advances in atomic force microscopy Rev. Mod. Phys. 75 949-83
7. Gotsmann B, Anczykowski B, Seidel C and Fuchs H 1999 Determination of tip-sample interaction forces from measured dynamic force spectroscopy curves Appl. Surf. Sci. 140 314-9
8. Hölscher H, Allers W, Schwarz U D, Schwarz A and Wiesendanger R 1999 Determination of tip-sample interaction potentials by dynamic force spectroscopy Phys. Rev. Lett. 83 4780-3
9. Dürig U 1999 Relations between interaction force and frequency shift in large-amplitude dynamic force microscopy Appl. Phys. Lett. 75 433-5
10. Gotsmann B, Seidel C, Anczykowski B and Fuchs H 1999 Conservative and dissipative tip-sample interaction forces probed with dynamic AFM Phys. Rev. B 60 11051-61
11. Dürig U 2000 Interaction sensing in dynamic force microscopy New J. Phys. 2 5
12. Hölscher H, Gotsmann B, Allers W, Schwarz U D, Fuchs H and Wiesendanger R 2001 Measurement of conservative and dissipative tip-sample interaction forces with a dynamic force microscope using the frequency modulation technique Phys. Rev. B 64 075402
13. Hölscher H, Schwarz A, Allers W, Schwarz U D and Wiesendanger R 2000 Quantitative analysis of dynamic-force-spectroscopy data on graphite(0001) in the contact and noncontact regimes Phys. Rev. B 61 12678-81
14. Guggisberg M, Bammerlin M, Loppacher Ch, Pfeiffer O, Abdurixit A, Barwich V, Bennewitz R, Baratoff A, Meyer E and Güntherodt H-J 2000 Separation of interactions by noncontact force microscopy Phys. Rev. B 61 11151-5
15. Gotsmann B and Fuchs H 2001 Dynamic force spectroscopy of conservative and dissipative forces in an Al-Au(111) tip-sample system Phys. Rev. Lett. 86 2597-600
16. Schirmeisen A and Hölscher H 2005 Velocity dependence of energy dissipation in dynamic force microscopy: hysteresis versus viscous damping Phys. Rev. B 72 1-7
17. Schirmeisen A, Weiner D and Fuchs H 2006 Singleatom contact mechanics: from atomic scale energy barrier to mechanical relaxation hysteresis Phys. Rev. Lett. 97 136101
18. Denk W and Pohl D W 1991 Local electrical dissipation imaged by scanning force microscopy Appl. Phys. Lett. 59 2171-3
19. Tamayo J and Garcia R 1997 Effects of elastic and inelastic interactions on phase contrast images in tapping-mode scanning force microscopy Appl. Phys. Lett. 71 2394-6
20. Lüthi R, Meyer E, Bammerlin M, Baratoff A, Howald L, Gerber Ch and Güntherodt H-J 1997 Ultrahigh vacuum atomic force microscopy: true atomic resolution Surf. Rev. Lett. 4 1025-9
21. Cleveland J P, Anczykowski B, Schmid A E and Elings V B 1998 Energy dissipation in tapping-mode atomic force microscopy Appl. Phys. Lett. 72 2613-5
22. Loppacher Ch, Bammerlin M, Guggisberg M, Schär S, Bennewitz R, Baratoff A, Meyer E and Guntherodt H-J 2000 Dynamic force microscopy of copper surfaces: atomic resolution and distance dependence of tip-sample interaction and tunneling current Phys. Rev. B 62 16944-9
23. Loppacher C, Bennewitz R, Pfeiffer O, Guggisberg M, Bammerlin M, Schär S, Barwich V, Baratoff A and Meyer E 2000 Experimental aspects of dissipation force microscopy Phys. Rev. B 62 13674-9
24. Hoffmann P M, Jeffery S, Pethica J B, Özer H Ö and Oral A 2001 Energy dissipation in atomic force microscopy and atomic loss processes Phys. Rev. Lett. 87 265502
25. Couturier G, Aime J P, Salardenne J, Boisgard R, Gourdon A and Gauthier S 2001 A mechanical approach to the dissipation process in nc-AFM: experiments, model and simulation Appl. Phys. A 72 S47
26. Volokitin AI and Persson B N J 2003 Noncontact friction between nanostructures Phys. Rev. B 68 1554201-12
27. Gauthier M and Tsukada M 1999 Theory of noncontact dissipation force microscopy Phys. Rev. B 60 11716-22
28. Sasaki N and Tsukada M 2000 Effect of microscopic nonconservative process on noncontact atomic force microscopy Japan. J. Appl. Phys. 39 L1334
29. Kantorovich L N and Trevethan T 2004 General theory of microscopic dynamical response in surface probe microscopy: from imaging to dissipation Phys. Rev. Lett. 93 236102
30. Trevethan T and Kantorovich L 2004 Atomistic simulations of the adhesion hysteresis mechanism of atomic scale dissipation in non-contact atomic force microscopy Nanotechnology 15 S34-9
31. Trevethan T and Kantorovich L 2006 Models of atomic scale contrast in dissipation images of binary ionic surfaces in non-contact atomic force microscopy Nanotechnology 17 205-12
32. Sugimoto Y, Jelinek P, Pou P, Abe M, Morita S, Perez R and Custance O 2007 Mechanism for room-temperature single-atom lateral manipulations on semiconductors using dynamic force microscopy Phys. Rev. Lett. 98 106104
33. Oyabu N, Pou P, Sugimoto Y, Jelinek P, Abe M, Morita S, Perez R and Custance O 2006 Single atomic contact adhesion and dissipation in dynamic force microscopy Phys. Rev. Lett. 96 1-4
34. Ghasemi S A, Goedecker S, Baratoff A, Lenosky T, Meyer E and Hug H J 2008 Ubiquitous mechanisms of energy dissipation in noncontact atomic force microscopy Phys. Rev. Lett. 100 236106
35. Roll T, Kunstmann T, Fendrich M, Mol̈ler R and Schleberger M 2008 Temperature dependence of the energy dissipation in dynamic force microscopy Nanotechnology 19 045703
36. Burke S A and Grütter P 2008 Comment on 'temperature dependence of the energy dissipation in dynamic force microscopy' Nanotechnology 19 398001
37. Barel I, Urbakh M, Jansen L and Schirmeisen A 2010 Multibond dynamics of nanoscale friction: the role of temperature Phys. Rev. Lett. 104 066104
38. Albrecht T R, Grutter P, Home D and Rugar D 1991 Frequency modulation detection using high-Q cantilevers for enhanced force microscope sensitivity J. Appl. Phys. 69 668-73
39. Sader J E, Larson I, Mulvaney P and White L R 1995 Method for the calibration of atomic force microscope cantilevers Rev. Sci. Instrum. 66 3789-98
40. Gysin U, Rast S, Ruff P, Meyer E, Lee D W, Vettiger P and Gerber C 2004 Temperature dependence of the force sensitivity of silicon cantilevers Phys. Rev. B 69 454031
41. Böhringer M, Schneider W-D, Berndt R, Glöckler K, Sokolowski M and Umbach E 1998 Corrugation reversal in scanning tunneling microscope images of organic molecules Phys. Rev. B 57 4081