Comment on 'Temperature dependence of the energy dissipation in dynamic force microscopy'

Nanotechnology

Volumn 19, Issue 39, 2008, Pages

  Burke, S A ^a   Grutter P ^a  

^a MCGILL UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CALCULATION; DYNAMIC FORCE MICROSCOPY; ENERGY CONSERVATION; ENERGY DISSIPATION; MICROSCOPY; NOTE; PRIORITY JOURNAL; ROOM TEMPERATURE; STATISTICS; TEMPERATURE DEPENDENCE; TOPOGRAPHY;

EID: 51349104222     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/19/39/398001     Document Type: Note

References (5)

1. Roll T, Kunstmann T, Fendrich M, Möller R and Schleberger M 2008 Temperature dependence of the energy dissipation in dynamic force microscopy Nanotechnology 19 045703
2. Mativetsky J M, Burke S A, Fostner S and Grutter P 2007 Templated growth of 3,4,9,10-perylenetetracarboxylic dianhydride molecules on a nanostructured insulator Nanotechnology 18 105303
3. Hug H J and Baratoff A 2002 Noncontact Atomic Force Microscopy (Berlin: Springer) chapter 20
4. Oyabu N, Pou P, Sugimoto Y, Jelinek P, Abe M, Morita S, Pérez R and Custance Ó 2006 Single atomic contact adhesion and dissipation in dynamic force microscopy Phys. Rev. Lett. 96 106101
5. Venegas de la Cerda M A, Madgavkar A, Abad J, Martrou D and Gauthier S 2008 Step-induced tip polarity reversal investigated by dynamic force microscopy on KBr(001) Nanotechnology 19 045503