Stochastic networked computation

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Volumn 18, Issue 10, 2010, Pages 1421-1432

  Varatkar, Girish Vishnu ^a   Narayanan, Sriram ^a   Shanbhag, Naresh R ^a   Jones, Douglas L ^a  

^a University of Illinois at Urbana Champaign   (United States)

Author keywords

Code division multiple access (CDMA); low power; nanoscale; process variations; reliability; robust; soft errors; stochastic

Indexed keywords

LOW POWER; NANO SCALE; PROCESS VARIATION; ROBUST; SOFT ERROR; STOCHASTIC;

CMOS INTEGRATED CIRCUITS; ERRORS; NANOSTRUCTURED MATERIALS; PROBABILITY DENSITY FUNCTION; STOCHASTIC SYSTEMS;

CODE DIVISION MULTIPLE ACCESS;

EID: 77957588938     PISSN: 10638210     EISSN: None     Source Type: Journal    
DOI: 10.1109/TVLSI.2009.2024673     Document Type: Article

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