High-performance robust latches

IEEE Transactions on Computers

Volumn 59, Issue 11, 2010, Pages 1455-1465

  Omaña, Martin ^a   Rossi, Daniele ^a   Metra, Cecilia ^a  

^a UNIVERSITY OF BOLOGNA   (Italy)

Author keywords

hardened latch; robust design; soft errors; static latch; Transient faults

Indexed keywords

HARDENED LATCHES; ROBUST DESIGNS; SOFT ERROR; STATIC LATCHES; TRANSIENT FAULTS;

ERRORS; HARDENING; MICROPROCESSOR CHIPS;

DESIGN;

EID: 77957557982     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/TC.2010.24     Document Type: Article

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