Surface channeling in aberration-corrected scanning transmission electron microscopy of nanostructures

Microscopy and Microanalysis

Volumn 16, Issue 4, 2010, Pages 425-433

  Liu, Jingyue ^a   Allard, Lawrence F ^b  

^a UNIVERSITY OF MISSOURI ST LOUIS   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

aberration free electron microscope; channeling; electron microscope; HAADF; nanostructure; STEM; surface; ZnO

Indexed keywords

EID: 77957229810     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927610000450     Document Type: Conference Paper

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