Effects of specimen tilt in ADF-STEM imaging of a-Si/c-Si interfaces

Ultramicroscopy

Volumn 108, Issue 5, 2008, Pages 494-501

  Yu, Z ^a   Muller, D A ^a   Silcox, J ^a  

^a Cornell University   (United States)

Author keywords

a Si c Si interfaces; Multislice simulations; STEM annular dark field; Tilt contrast

Indexed keywords

AMORPHOUS SILICON; TRANSMISSION ELECTRON MICROSCOPY;

ANNULAR DARK FIELD; MULTISLICE SIMULATIONS;

SINGLE CRYSTALS;

ARTICLE; CRYSTALLOGRAPHY; DIFFRACTION; IMAGE PROCESSING; IMAGE QUALITY; SIMULATION; TRANSMISSION ELECTRON MICROSCOPY;

EID: 40749100109     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2007.08.007     Document Type: Article

References (27)

1. Crewe A.V., Wall J., and Welter L.M. J. Appl. Phys. 39 (1968) 5861
2. Pennycook S.J., and Boatner L.A. Nature 336 (1988) 565
3. Loane R.F., Kirkland E.J., and Silcox J. Acta Crystallogr., A 44 (1988) 912
4. Muller D.A., et al. Nature 399 (1999) 758
5. Fertig J., and Rose H. Optik 59 (1981) 407
6. Hillyard S., Loane R.F., and Silcox J. Ultramicroscopy 49 (1993) 14
7. Vonhugo D., Kohl H., and Rose H. Ultramicroscopy 17 (1985) 303
8. Buxton B.F., Loveluck J.E., and Steeds J.W. Philos. Mag. A 38 (1978) 259
9. Howie A. Philos. Mag. 14 (1966) 223
10. Kambe K., Lehmpfuhl G., and Fujimoto F. Z. Naturforsch. A 29 (1974) 1034
11. Wang P., et al. Ultramicroscopy 106 (2006) 277
12. Fitting L., et al. Ultramicroscopy 106 (2006) 1053
13. Howie A. J. Microsc. (Oxf.) 117 (1979) 11
14. Hillyard S., and Silcox J. Ultramicroscopy 58 (1995) 6
15. Hirsch P.B., et al. Electron Microscopy of Thin Crystals (1977), Krieger publishing Company, Florida
16. J.P. Benedict, R.M. Anderson, S.J. Klepeis, 1996, p. 277.
17. Voyles P.M., Grazul J.L., and Muller D.A. Ultramicroscopy 96 (2003) 251
18. Hillyard S., and Silcox J. Ultramicroscopy 52 (1993) 325
19. Cowley J.M., and Moodie A.F. Acta Crystallogr. 10 (1957) 609
20. Goodman P., and Moodie A.F. Acta Crystallogr., A 30 (1974) 280
21. Ishizuka K., and Uyeda N. Acta Crystallogr., A 33 (1977) 740
22. Self P.G., et al. Ultramicroscopy 11 (1983) 35
23. Kirkland E.J., Loane R.F., and Silcox J. Ultramicroscopy 23 (1987) 77
24. Ishizuka K. Ultramicroscopy 90 (2002) 71
25. Loane R.F., Xu P.R., and Silcox J. Acta Crystallogr., A 47 (1991) 267
26. Kirkland E.J. Advanced Computing in Electron Microscopy (1998), Plenum Press, New York
27. Yu Z.H., Muller D.A., and Silcox J. J. Appl. Phys. 95 (2004) 3362