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Volumn , Issue , 2010, Pages 1707-1710

SRAM design in fully-depleted SOI technology

Author keywords

[No Author keywords available]

Indexed keywords

3D DEVICE SIMULATION; ANALYTICAL MODELING; BULK CMOS; BURIED OXIDES; FULLY DEPLETED; SOI FINFETS; SOI TECHNOLOGY; SOI-MOSFETS; SRAM CELL; SRAM DESIGN;

EID: 77955997314     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISCAS.2010.5537520     Document Type: Conference Paper
Times cited : (3)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.