SCOPUS 정보 검색 플랫폼

Volumn 108, Issue 3, 2010, Pages

Asymmetric hysteresis loops and smearing of the dielectric anomaly at the transition temperature due to space charges in ferroelectric thin films

(3) Misirlioglu, I B a Okatan, M B b Alpay, S P b

a SABANCI UNIVERSITY (Turkey)

b UNIVERSITY OF CONNECTICUT (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELDS; ELECTRIC SPACE CHARGE; ENGINEERING EXHIBITIONS; FERROELECTRIC FILMS; FERROELECTRIC MATERIALS; FERROELECTRIC THIN FILMS; FERROELECTRICITY; HYSTERESIS; HYSTERESIS LOOPS; MAGNETIC MATERIALS; POLARIZATION; TEMPERATURE; VAPOR DEPOSITION;

APPLIED FIELD; ASYMMETRIC HYSTERESIS; COERCIVE FIELD; CONTINUOUS DISTRIBUTION; DEFECT-FREE; DIELECTRIC ANOMALY; DIELECTRIC RESPONSE; ELECTRIC FIELD HYSTERESIS LOOP; ELECTRICAL FIELD; ELECTRONIC ASYMMETRY; EXTERNAL ELECTRIC FIELD; FERROELECTRIC INTERFACE; FILM-ELECTRODE INTERFACES; HYSTERESIS RESPONSE; METALLIC ELECTRODES; NONLINEAR THERMODYNAMICS; PHASE TRANSITION TEMPERATURES; SPACE CHARGE DISTRIBUTIONS; SPACE CHARGE REGIONS; SPACE CHARGES; SRTIO; SURFACE FIELD; TEMPERATURE RANGE; TRANSITION TEMPERATURE;

PHASE TRANSITIONS;

EID: 77955916586 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3457348 Document Type: Article

Times cited : (47)

References (36)

1
- 36149017028
- PHRVAO 0031-899X, 10.1103/PhysRev.118.100
- S. Triebwasser, Phys. Rev. PHRVAO 0031-899X 118, 100 (1960). 10.1103/PhysRev.118.100
- (1960) Phys. Rev. , vol.118 , pp. 100
- Triebwasser, S.¹

2
- 77955910661
- in, Ferroelectricity and Related Phenomena, edited by W. Taylor, (OPA, Amsterdam)
- A. P. Levanyuk and A. S. Sigov, in Defects and Structural Phase Transitions, Ferroelectricity and Related Phenomena, edited by, W. Taylor, Vol. 6 (OPA, Amsterdam, 1988).
- (1988) Defects and Structural Phase Transitions , vol.6
- Levanyuk, A.P.¹ Sigov, A.S.²

3
- 0000766587
- PLRBAQ 0556-2805, 10.1103/PhysRevB.61.15042
- A. M. Bratkovsky and A. P. Levanyuk, Phys. Rev. B PLRBAQ 0556-2805 61, 15042 (2000). 10.1103/PhysRevB.61.15042
- (2000) Phys. Rev. B , vol.61 , pp. 15042
- Bratkovsky, A.M.¹ Levanyuk, A.P.²

4
- 29744464077
- Metal-ferroelectric-metal heterostructures with Schottky contacts. I. Influence of the ferroelectric properties
- DOI 10.1063/1.2148622, 124103
- T. Pintilie and M. Alexe, J. Appl. Phys. JAPIAU 0021-8979 98, 124103 (2005). 10.1063/1.2148622 (Pubitemid 43032126)
- (2005) Journal of Applied Physics , vol.98 , Issue.12 , pp. 1-8
- Pintilie, L.¹ Alexe, M.²

5
- 33244474632
- Depletion layers and domain walls in semiconducting ferroelectric thin films
- DOI 10.1103/PhysRevLett.95.247603
- Y. Xiao, V. B. Shenoy, and K. Bhattacharya, Phys. Rev. Lett. PRLTAO 0031-9007 95, 247603 (2005). 10.1103/PhysRevLett.95.247603 (Pubitemid 43272885)
- (2005) Physical Review Letters , vol.95 , Issue.24 , pp. 247603
- Xiao, Y.¹ Shenoy, V.B.² Bhattacharya, K.³

6
- 33748849243
- Interface-induced phenomena in polarization response of ferroelectric thin films
- DOI 10.1063/1.2337009
- A. K. Tagantsev and G. Gerra, J. Appl. Phys. JAPIAU 0021-8979 100, 051607 (2006). 10.1063/1.2337009 (Pubitemid 44422009)
- (2006) Journal of Applied Physics , vol.100 , Issue.5 , pp. 051607
- Tagantsev, A.K.¹ Gerra, G.²

7
- 34347323975
- PLRBAQ 0556-2805, 10.1103/PhysRevB.75.224113
- L. Pintilie, Phys. Rev. B PLRBAQ 0556-2805 75, 224113 (2007). 10.1103/PhysRevB.75.224113
- (2007) Phys. Rev. B , vol.75 , pp. 224113
- Pintilie, L.¹

8
- 58149266702
- JAPIAU 0021-8979, 10.1063/1.3021293
- L. Pintilie, I. Vrejoiu, M. Alexe, and D. Hesse, J. Appl. Phys. JAPIAU 0021-8979 104, 114101 (2008). 10.1063/1.3021293
- (2008) J. Appl. Phys. , vol.104 , pp. 114101
- Pintilie, L.¹ Vrejoiu, I.² Alexe, M.³ Hesse, D.⁴

9
- 0000800571
- APPLAB 0003-6951, 10.1063/1.117418
- E. G. Lee, D. J. Wouters, G. Willems, and H. E. Maes, Appl. Phys. Lett. APPLAB 0003-6951 69, 1223 (1996). 10.1063/1.117418
- (1996) Appl. Phys. Lett. , vol.69 , pp. 1223
- Lee, E.G.¹ Wouters, D.J.² Willems, G.³ Maes, H.E.⁴

10
- 9944219646
- JAPIAU 0021-8979, 10.1063/1.1789635
- G. Le Rhun, R. Bouregba, and G. Poullain, J. Appl. Phys. JAPIAU 0021-8979 96, 5712 (2004). 10.1063/1.1789635
- (2004) J. Appl. Phys. , vol.96 , pp. 5712
- Le Rhun, G.¹ Bouregba, R.² Poullain, G.³

11
- 19744381013
- See, for example, PLRBAQ 0556-2805, 10.1103/PhysRevB.70.092103;, Appl. Phys. Lett. APPLAB 0003-6951 88, 102906 (2006). 10.1063/1.2178194
- See, for example, D. Balzar, P. A. Ramakrishnan, and A. M. Hermann, Phys. Rev. B PLRBAQ 0556-2805 70, 092103 (2004) 10.1103/PhysRevB.70.092103; I. B. Misirlioglu, S. P. Alpay, M. Aindow, and V. Nagarajan, Appl. Phys. Lett. APPLAB 0003-6951 88, 102906 (2006). 10.1063/1.2178194
- (2004) Phys. Rev. B , vol.70 , pp. 092103
- Balzar, D.¹ Ramakrishnan, P.A.² Hermann, A.M.³ Misirlioglu, I.B.⁴ Alpay, S.P.⁵ Aindow, M.⁶ Nagarajan, V.⁷

12
- 0001462362
- Measurement of interface trap states in metal-ferroelectric-silicon heterostructures
- DOI 10.1063/1.121337, PII S0003695198002186
- M. Alexe, Appl. Phys. Lett. APPLAB 0003-6951 72, 2283 (1998). 10.1063/1.121337 (Pubitemid 128671535)
- (1998) Applied Physics Letters , vol.72 , Issue.18 , pp. 2283-2285
- Alexe, M.¹

13
- 0001426215
- APPLAB 0003-6951, 10.1063/1.1290691
- D. O'Neill, R. M. Bowman, and J. M. Gregg, Appl. Phys. Lett. APPLAB 0003-6951 77, 1520 (2000). 10.1063/1.1290691
- (2000) Appl. Phys. Lett. , vol.77 , pp. 1520
- O'Neill, D.¹ Bowman, R.M.² Gregg, J.M.³

14
- 33751181013
- IFEREU 1058-4587, 10.1080/10584580490441683
- J. Mcaneney, L. J. Sinnamon, A. Lookman, R. M. Bowman, and J. M. Gregg, Integr. Ferroelectr. IFEREU 1058-4587 60, 79 (2004). 10.1080/10584580490441683
- (2004) Integr. Ferroelectr. , vol.60 , pp. 79
- McAneney, J.¹ Sinnamon, L.J.² Lookman, A.³ Bowman, R.M.⁴ Gregg, J.M.⁵

15
- 21044448384
- Effect of built-in bias fields on the nanoscale switching in ferroelectric thin films
- DOI 10.1007/s00339-003-2348-5
- D. Fu, K. Suzuki, K. Kato, and H. Suzuki, Appl. Phys. A: Mater. Sci. Process. APAMFC 0947-8396 80, 1067 (2005). 10.1007/s00339-003-2348-5 (Pubitemid 40871791)
- (2005) Applied Physics A: Materials Science and Processing , vol.80 , Issue.5 , pp. 1067-1070
- Fu, D.¹ Suzuki, K.² Kato, K.³ Suzuki, H.⁴

16
- 33845748695
- Space charge effects in ferroelectric thin films
- DOI 10.1063/1.2382459
- P. Zubko, D. J. Jung, and J. F. Scott, J. Appl. Phys. JAPIAU 0021-8979 100, 114112 (2006). 10.1063/1.2382459 (Pubitemid 46012220)
- (2006) Journal of Applied Physics , vol.100 , Issue.11 , pp. 114112
- Zubko, P.¹ Jung, D.J.² Scott, J.F.³

17
- 67449089710
- PLRBAQ 0556-2805, 10.1103/PhysRevB.79.174113;, Acta Mater. ACMAFD 1359-6454 58, 39 (2010). 10.1016/j.actamat.2009.08.055
- M. B. Okatan, J. V. Mantese, and S. P. Alpay, Phys. Rev. B PLRBAQ 0556-2805 79, 174113 (2009) 10.1103/PhysRevB.79.174113; M. B. Okatan, J. V. Mantese, and S. P. Alpay, Acta Mater. ACMAFD 1359-6454 58, 39 (2010). 10.1016/j.actamat.2009.08.055
- (2009) Phys. Rev. B , vol.79 , pp. 174113
- Okatan, M.B.¹ Mantese, J.V.² Alpay, S.P.³ Okatan, M.B.⁴ Mantese, J.V.⁵ Alpay, S.P.⁶

18
- 33748690333
- Radiation effects on switching kinetics of three-dimensional ferroelectric capacitor arrays
- DOI 10.1063/1.2339044
- L. Courtade, C. Muller, G. Andreoli, C. Turquat, L. Goux, and D. J. Wouters, Appl. Phys. Lett. APPLAB 0003-6951 89, 113501 (2006). 10.1063/1.2339044 (Pubitemid 44396645)
- (2006) Applied Physics Letters , vol.89 , Issue.11 , pp. 113501
- Courtade, L.¹ Muller, Ch.² Andreoli, G.³ Turquat, Ch.⁴ Goux, L.⁵ Wouters, D.J.⁶

19
- 33747179838
- 9 ferroelectric capacitors
- DOI 10.1016/j.sse.2006.06.010, PII S0038110106002310
- L. Goux, Z. Xu, V. Paraschiv, J. G. Lisoni, D. Maes, L. Haspeslagh, G. Groeseneken, and D. J. Wouters, Solid-State Electron. SSELA5 0038-1101 50, 1227 (2006). 10.1016/j.sse.2006.06.010 (Pubitemid 44232868)
- (2006) Solid-State Electronics , vol.50 , Issue.7-8 , pp. 1227-1233
- Goux, L.¹ Xu, Z.² Paraschiv, V.³ Lisoni, J.G.⁴ Maes, D.⁵ Haspeslagh, L.⁶ Groeseneken, G.⁷ Wouters, D.J.⁸

20
- 0034272503
- JVTAD6 0734-2101, 10.1116/1.1288195
- W. B. Wu, K. H. Wong, C. L. Mak, C. L. Choy, and Y. H. Zhang, J. Vac. Sci. Technol. A JVTAD6 0734-2101 18, 2412 (2000). 10.1116/1.1288195
- (2000) J. Vac. Sci. Technol. A , vol.18 , pp. 2412
- Wu, W.B.¹ Wong, K.H.² Mak, C.L.³ Choy, C.L.⁴ Zhang, Y.H.⁵

21
- 19144366885
- Interface-oxygen-loss-controlled voltage offsets in epitaxial Pb (Zr0.52 Ti0.48) O3 thin-film capacitors with La0.7 Sr0.3 Mn O3 electrodes
- DOI 10.1063/1.1827929
- W. B. Wu, K. H. Wong, and C. L. Choy, Appl. Phys. Lett. APPLAB 0003-6951 85, 5013 (2004). 10.1063/1.1827929 (Pubitemid 40715198)
- (2004) Applied Physics Letters , vol.85 , Issue.21 , pp. 5013-5015
- Wu, W.¹ Wong, K.H.² Choy, C.L.³

22
- 33947140450
- 12 thin films annealed in different atmospheres
- DOI 10.1016/j.materresbull.2006.08.014, PII S002554080600345X
- A. Z. Simoes, C. S. Riccardi, A. H. M. Gonzalez, A. Ries, E. Longo, and J. A. Varela, Mater. Res. Bull. MRBUAC 0025-5408 42, 967 (2007). 10.1016/j.materresbull.2006.08.014 (Pubitemid 46412374)
- (2007) Materials Research Bulletin , vol.42 , Issue.5 , pp. 967-974
- Simoes, A.Z.¹ Riccardi, C.S.² Gonzalez, A.H.M.³ Ries, A.⁴ Longo, E.⁵ Varela, J.A.⁶

23
- 67650236721
- JAPIAU 0021-8979, 10.1063/1.3141733
- L. Feigl, E. Pippel, L. Pintilie, M. Alexe, and D. Hesse, J. Appl. Phys. JAPIAU 0021-8979 105, 126103 (2009). 10.1063/1.3141733
- (2009) J. Appl. Phys. , vol.105 , pp. 126103
- Feigl, L.¹ Pippel, E.² Pintilie, L.³ Alexe, M.⁴ Hesse, D.⁵

24
- 27744452888
- Nature of nonlinear imprint in ferroelectric films and long-term prediction of polarization loss in ferroelectric memories
- DOI 10.1063/1.1805190
- A. K. Tagantsev, I. Stolichnov, N. Setter, and J. S. Cross, J. Appl. Phys. JAPIAU 0021-8979 96, 6616 (2004). 10.1063/1.1805190 (Pubitemid 44938252)
- (2004) Journal of Applied Physics , vol.96 , Issue.11 , pp. 6616-6623
- Tagantsev, A.K.¹ Stolichnov, I.² Setter, N.³ Cross, J.S.⁴

25
- 10844232375
- Modelling of dielectric hysteresis loops in ferroelectric semiconductors with charged defects
- DOI 10.1088/0953-8984/16/49/010, PII S0953898404855206
- A. N. Morozovska and E. A. Eliseev, J. Phys. Condens. Matter JCOMEL 0953-8984 16, 8937 (2004). 10.1088/0953-8984/16/49/010 (Pubitemid 40005826)
- (2004) Journal of Physics Condensed Matter , vol.16 , Issue.49 , pp. 8937-8956
- Morozovska, A.N.¹ Eliseev, E.A.²

26
- 23844446119
- Mechanisms of imprint effect on ferroelectric thin films
- DOI 10.1063/1.1984075, 024111
- Y. Zhou, H. K. Chan, C. H. Lam, and F. G. Shin, J. Appl. Phys. JAPIAU 0021-8979 98, 024111 (2005). 10.1063/1.1984075 (Pubitemid 41144564)
- (2005) Journal of Applied Physics , vol.98 , Issue.2 , pp. 1-9
- Zhou, Y.¹ Chan, H.K.² Lam, C.H.³ Shin, F.G.⁴

27
- 33646799441
- Simulation of flexoelectricity effect on imprint behavior of ferroelectric thin films
- DOI 10.1016/j.ssc.2006.03.031, PII S0038109806002821
- H. X. Cao, V. C. Lo, and Z. Y. Li, Solid State Commun. SSCOA4 0038-1098 138, 404 (2006). 10.1016/j.ssc.2006.03.031 (Pubitemid 43766604)
- (2006) Solid State Communications , vol.138 , Issue.8 , pp. 404-408
- Cao, H.-X.¹ Lo, V.C.² Li, Z.-Y.³

28
- 34547140211
- Space charge contribution to the apparent enhancement of polarization in ferroelectric bilayers and multilayers
- DOI 10.1063/1.2757127
- I. B. Misirlioglu, M. Alexe, L. Pintilie, and D. Hesse, Appl. Phys. Lett. APPLAB 0003-6951 91, 022911 (2007). 10.1063/1.2757127 (Pubitemid 47114761)
- (2007) Applied Physics Letters , vol.91 , Issue.2 , pp. 022911
- Misirlioglu, I.B.¹ Alexe, M.² Pintilie, L.³ Hesse, D.⁴

29
- 70350741021
- JAPIAU 0021-8979, 10.1063/1.3240331
- O. Dahl, J. K. Grepstad, and T. Tybell, J. Appl. Phys. JAPIAU 0021-8979 106, 084104 (2009). 10.1063/1.3240331
- (2009) J. Appl. Phys. , vol.106 , pp. 084104
- Dahl, O.¹ Grepstad, J.K.² Tybell, T.³

30
- 71149120747
- ZZZZZZ 1862-6254, 10.1002/pssr.200903194
- X. J. Zheng, W. Yin, T. Zhang, Q. Chen, M. H. Tang, and J. Sun Phys. Status Solidi (RRL) ZZZZZZ 1862-6254 3, 251 (2009). 10.1002/pssr.200903194
- (2009) Phys. Status Solidi (RRL) , vol.3 , pp. 251
- Zheng, X.J.¹ Yin, W.² Zhang, T.³ Chen, Q.⁴ Tang, M.H.⁵ Sun, J.⁶

31
- 69949147934
- APPLAB 0003-6951, 10.1063/1.3222871
- M. B. Okatan and S. P. Alpay, Appl. Phys. Lett. APPLAB 0003-6951 95, 092902 (2009). 10.1063/1.3222871
- (2009) Appl. Phys. Lett. , vol.95 , pp. 092902
- Okatan, M.B.¹ Alpay, S.P.²

32
- 68949145975
- FEROA8 0015-0193, 10.1080/00150190802437746
- A. K. Tagantsev, Ferroelectrics FEROA8 0015-0193 375, 19 (2008). 10.1080/00150190802437746
- (2008) Ferroelectrics , vol.375 , pp. 19
- Tagantsev, A.K.¹

33
- 84963155794
- FEROA8 0015-0193
- M. J. Haun, Z. Q. Zhuang, E. Furman, S. J. Jang, and L. E. Cross, Ferroelectrics FEROA8 0015-0193 99, 45 (1989).
- (1989) Ferroelectrics , vol.99 , pp. 45
- Haun, M.J.¹ Zhuang, Z.Q.² Furman, E.³ Jang, S.J.⁴ Cross, L.E.⁵

34
- 11744388456
- PRLTAO 0031-9007, 10.1103/PhysRevLett.80.1988
- N. A. Pertsev, A. G. Zembilgotov, and A. K. Tagantsev, Phys. Rev. Lett. PRLTAO 0031-9007 80, 1988 (1998). 10.1103/PhysRevLett.80.1988
- (1998) Phys. Rev. Lett. , vol.80 , pp. 1988
- Pertsev, N.A.¹ Zembilgotov, A.G.² Tagantsev, A.K.³

35
- 34047159909
- See, for example, JAPIAU 0021-8979, 10.1063/1.2713081;, J. Appl. Phys. JAPIAU 0021-8979 101, 064115 (2007). 10.1063/1.2713348
- See, for example, E. K. Akdogan and A. Safari, J. Appl. Phys. JAPIAU 0021-8979 101, 064114 (2007) 10.1063/1.2713081; E. K. Akdogan and A. Safari, J. Appl. Phys. JAPIAU 0021-8979 101, 064115 (2007). 10.1063/1.2713348
- (2007) J. Appl. Phys. , vol.101 , pp. 064114
- Akdogan, E.K.¹ Safari, A.² Akdogan, E.K.³ Safari, A.⁴

36
- 18144362876
- Smearing of phase transition due to a surface effect or a bulk inhomogeneity in ferroelectric nanostructures
- DOI 10.1103/PhysRevLett.94.107601, 107601
- A. M. Bratkovsky and A. P. Levanyuk, Phys. Rev. Lett. PRLTAO 0031-9007 94, 107601 (2005). 10.1103/PhysRevLett.94.107601 (Pubitemid 40618404)
- (2005) Physical Review Letters , vol.94 , Issue.10 , pp. 1-4
- Bratkovsky, A.M.¹ Levanyuk, A.P.²

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.